Microelectronic Failure Analysis - Technical Foundation Lectures

Managers and practicing engineers of failure analysis departments 30 Microelectronic Failure Analysis lectures were given at the University of New Mexico (UMN) in the Fall Semester of 1997. The graduate course was a joint venture of the University of New Mexico (UNM), Sandia National Labs, and the Product Analysis Forum (PAF) of Sematech. Participating lecturers were from AMD, Analytical Solutions, Delco, Ford Microelectronics, Hewlett-Packard, IBM, Intel, Sandia National Labs, Texas Instruments, and the University of New Mexico. Each 75-minute lecture was held at UNM and transmitted via satellite to manufacturing sites across the USA. The participants had wide backgrounds with major degree backgrounds in Electrical Engineering, Chemical Engineering, and Physics. The academic level of the audience ranged from PhD, MS, BS to BET. The prerequisites were basic knowledge of transistor devices (MOSFET) and IC technology. This product contains the eight technical foundation lectures from that 1997 Microelectronic Failure Analysis video tutorial, which focus on the scope of FA, process knowledge, logic design, testability, reliability, packaging, and defect electrical properties.