Statistical Methods for Reliability Data (eBook)
712 Seiten
John Wiley & Sons (Verlag)
978-1-118-62597-2 (ISBN)
five favorite books in the September 2003 issue. Statistical
Methods for Reliability Data was among those chosen.
Bringing statistical methods for reliability testing in line
with the computer age This volume presents state-of-the-art,
computer-based statistical methods for reliability data analysis
and test planning for industrial products. Statistical Methods
for Reliability Data updates and improves established
techniques as it demonstrates how to apply the new graphical,
numerical, or simulation-based methods to a broad range of models
encountered in reliability data analysis. It includes methods for
planning reliability studies and analyzing degradation data,
simulation methods used to complement large-sample asymptotic
theory, general likelihood-based methods of handling arbitrarily
censored data and truncated data, and more. In this book, engineers
and statisticians in industry and academia will find:
* A wealth of information and procedures developed to give
products a competitive edge
* Simple examples of data analysis computed with the S-PLUS
system-for which a suite of functions and commands is available
over the Internet
* End-of-chapter, real-data exercise sets
* Hundreds of computer graphics illustrating data, results of
analyses, and technical concepts
An essential resource for practitioners involved in product
reliability and design decisions, Statistical Methods for
Reliability Data is also an excellent textbook for on-the-job
training courses, and for university courses on applied reliability
data analysis at the graduate level.
An Instructor's Manual presenting detailed solutions to all the
problems in the book is available upon requestfrom the Wiley
editorial department.
WILLIAM Q. MEEKER, PhD, is Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is a Fellow of the American Statistical Association and an elected member of the International Statistics Institute. Among his many awards and honors are the Youdan Prize and two Wilcoxon Prizes as well as two awards for outstanding teaching at Iowa State. He is coauthor of Statistical Intervals: A Guide for Practitioners (Wiley) and of numerous book chapters and publications in the engineering and statistical literature. A former editor of Technometrics and coeditor of Selected Tables in Mathematical Statistics, he is currently Associate Editor for International Statistical Review. LUIS A. ESCOBAR, PhD, is a Professor in the Department of Experimental Statistics at Louisiana State University. His research and consulting interests include statistical analysis of reliability data, accelerated testing, survival analysis, and nonlinear models. An Associate Editor for Technometrics and the IIE Transactions of Quality and Reliability Engineering, Professor Escobar is a Fellow of the American Statistical Association and elected member of the International Statistics Institute. He is the author of several book chapters, and his publications have appeared in the engineering and statistical literature.
Partial table of contents:
Reliability Concepts and Reliability Data.
Nonparametric Estimation.
Other Parametric Distributions.
Probability Plotting.
Bootstrap Confidence Intervals.
Planning Life Tests.
Degradation Data, Models, and Data Analysis.
Introduction to the Use of Bayesian Methods for Reliability
Data.
Failure-Time Regression Analysis.
Accelerated Test Models.
Accelerated Life Tests.
Case Studies and Further Applications.
Epilogue.
Appendices.
References.
Indexes.
"...provides state-of-the-art developments in reliability
theory and applications." (Journal of Statistical Computation
and Simulation, June 2005)
This title has been awarded the: Association of American Publishers Professional/Scholarly Publishing Division Award for Excellence and Innovation in Engineering
| Erscheint lt. Verlag | 21.8.2014 |
|---|---|
| Reihe/Serie | Wiley Series in Probability and Statistics | Wiley Series in Probability and Statistics |
| Sprache | englisch |
| Themenwelt | Mathematik / Informatik ► Mathematik ► Statistik |
| Mathematik / Informatik ► Mathematik ► Wahrscheinlichkeit / Kombinatorik | |
| Technik | |
| Schlagworte | Qualität, Produktivität u. Zuverlässigkeit • Qualität, Produktivität u. Zuverlässigkeit • Quality, Productivity & Reliability • Statistics • Statistik • Technische Zuverlässigkeit • Technische Zuverlässigkeit |
| ISBN-10 | 1-118-62597-8 / 1118625978 |
| ISBN-13 | 978-1-118-62597-2 / 9781118625972 |
| Haben Sie eine Frage zum Produkt? |
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