Single Event Phenomena

G.C. Messenger, Milton Ash (Autoren)

Buch | Softcover

351 Seiten

2014 | Softcover reprint of the original 1st ed. 1997
Springer-Verlag New York Inc.
978-1-4613-7770-2 (ISBN)

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This monograph is written for neophytes, students, and practitioners to aid in their understanding of single event phenomena. It attempts to collect the highlights as well as many of the more detailed aspects of this field into an entity that portrays the theoretical as well as the practical applications of this subject. Those who claim that "theory" is not for them can skip over the earlier chapters dealing with the fundamental and theoretical portions and find what they need in the way of hands-on guidelines and pertinent formulas in the later chapters. Perhaps, after a time they will return to peruse the earlier chapters for a more complete rendition and appreciation of the subject matter. It is felt that the reader should have some acquaintance with the electronics of semiconductors and devices, some broad atomic physics introduction, as well as a respectable level of mathematics through calculus, including simple differential equations. A large part of the preceding can be obtained informally, through job experience, self-study, evening classes, as well as from a formal college curriculum.

1 Preliminaries.- 1.1 Introduction.- 1.2 Fluence, Flux, and Current Density.- 1.3 Cross Sections.- 1.4 Chord Distribution Functions.- Problems.- References.- 2 Extraterrestrial SEU-Inducing Particles.- 2.1 Introduction.- 2.2 Cosmic Rays.- 2.3 Other Cosmic Ray Particles.- 2.4 Alpha Particles.- 2.5 Solar Flares.- 2.6 Van Allen Radiation Belts.- Problems.- References.- 3 Particle Penetration and Energy Deposition.- 3.1 Introduction.- 3.2 Particle Penetration in Materials.- 3.3 Range.- 3.4 Ionization Loss.- 3.5 Bremsstrahlung Loss.- 3.6 Pair Production, Cosmic Ray Showers.- 3.7 LET Introduction.- 3.8 LET Spectra (Heinrich) Curve.- 3.9 Linear Energy Transfer (LET) Applicability.- Problems.- References.- 4 Single Event Upset: Experimental.- 4.1 Introduction.- 4.2 Heavy-Ion Accelerators.- 4.3 Critical LET, Critical Charge.- 4.4 Californum-252 Sources.- 4.5 Lasers.- Problems.- References.- 5 Single Event Upset Error Rates.- 5.1 Introduction.- 5.2 Geosynchronous SEU.- 5.3 Proton-Induced SEU.- 5.4 Neutron-Induced SEU.- 5.5 Alpha-Particle-Induced SEU.- 5.6 Ground-Level SEU.- Problems.- References.- 6 Single Event Phenomena I.- 6.1 Introduction.- 6.2 Funneling.- 6.3 Track Transport.- 6.4 SEU Cross-Section Morphology.- 6.5 Device SEU Scaling.- 6.6 Single Event Latchup.- 6.7 South Atlantic Anomaly, Low Earth Orbits.- 6.8 Single Event Gate Rupture, Device SEU Burnout.- Problems.- References.- 7 Single Event Phenomena II.- 7.1 Introduction.- 7.2 Multiple Event Upsets.- 7.3 Ionizing Dose Effects.- 7.4 Redundancy, Scrubbing.- 7.5 Error Detection and Correction.- 7.6 SEU Shielding.- 7.7 Radiation Sensors and Detectors.- Problems.- References.- 8 Single Event Upset Practice.- 8.1 Introduction.- 8.2 Geosynchronous SEU Error Rate Computations.- 8.3 Proton-Induced SEU II.- 8.4 Neutron-InducedSEU II.- 8.5 Single Event Latchup II.- 8.6 Single Event Burnout II.- 8.7 Guidelines.- Glossary for Tables 8.13–8.17.- Appendices 8.1–8.3.- Problems.- References.

Zusatzinfo	XVII, 351 p.
Verlagsort	New York, NY
Sprache	englisch
Maße	152 x 229 mm
Themenwelt	Technik ► Elektrotechnik / Energietechnik
ISBN-10	1-4613-7770-6 / 1461377706
ISBN-13	978-1-4613-7770-2 / 9781461377702
Zustand	Neuware