Ferroelectric Thin Films X: Volume 688 -

Ferroelectric Thin Films X: Volume 688

Buch | Softcover
444 Seiten
2014
Cambridge University Press (Verlag)
978-1-107-41211-8 (ISBN)
28,65 inkl. MwSt
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This book, the tenth in a highly successful series from the Materials Research Society, presents technical information on ferroelectric thin films from academia, government laboratories, and industry. Substantial progress in several areas of integrated ferroelectric and high-permittivity device technology are demonstrated. In particular, the latest developments in high-density FeRAM devices are reviewed, as are developments in the use of these films in piezoelectric, pyroelectric, tunable RF, integrated capacitor, and optical waveguide applications. Thin-film processing techniques used to deposit a variety of ferroelectric and electrode materials are also highlighted, and recent advances in the fundamental understanding of ferroelectricity and degradation phenomena in thin films are addressed. Topics include: processing of Pb-based ferroelectrics; processing of Bi-based ferroelectrics; ferroelectric nonvolatile memories - technology, fundamentals and integration; integration and electrodes; epitaxial ferroelectric films; domains and nanostructures; piezoelectrics and pyroelectrics; ferroelectric gates; thin films for RF applications and high-permittivity materials.
Erscheint lt. Verlag 5.6.2014
Reihe/Serie MRS Proceedings
Verlagsort Cambridge
Sprache englisch
Maße 152 x 229 mm
Gewicht 590 g
Themenwelt Technik Elektrotechnik / Energietechnik
Technik Maschinenbau
ISBN-10 1-107-41211-0 / 1107412110
ISBN-13 978-1-107-41211-8 / 9781107412118
Zustand Neuware
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