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Electromagnetic Wave Scattering from Random Rough Surfaces: Asymptotic models

N Pinel (Autor)

Software / Digital Media
266 Seiten
2013
John Wiley & Sons Inc (Hersteller)
978-1-118-57915-2 (ISBN)
167,91 inkl. MwSt
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Electromagnetic wave scattering from random rough surfaces is an active, interdisciplinary area of research with myriad practical applications in fields such as optics, acoustics, geoscience and remote sensing.
Focusing on the case of random rough surfaces, this book presents classical asymptotic models used to describe electromagnetic wave scattering. The authors begin by outlining the basic concepts relevant to the topic before moving on to look at the derivation of the scattered field under asymptotic models, based on the Kirchhoff-tangent plane, in order to calculate both the scattered field and the statistical average intensity.
More elaborated asymptotic models are also described for dealing with specific cases, and numerical results are presented to illustrate these models. Comparisons with a reference numerical method are made to confirm and refine the theoretical validity domains.
The final chapter derives the expressions of the scattering intensities of random rough surfaces under the asymptotic models. Its expressions are given for their incoherent contributions, from statistical calculations. These results are then compared with numerical computations using a Monte-Carlo process, as well as with experimental models, for sea surface backscattering.
Contents

1. Electromagnetic Wave Scattering from Random Rough Surfaces: Basics.
2. Derivation of the Scattered Field under Asymptotic Models.
3. Derivation of the Normalized Radar Cross-Section under Asymptotic Models.
APPENDIX 1. Far-Field Scattered Fields under the Method of Stationary Phase.
APPENDIX 2. Calculation of the Scattering Coefficients under the GO for 3D Problems.

About the Authors

Nicolas Pinel worked as a Research Engineer at the IETR (Institut d'Electronique et de Telecommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) before joining Alyotech Technologies in Rennes, France, in July 2013. His research interests are in the areas of radar and optical remote sensing, scattering and propagation. In particular, he works on asymptotic methods of electromagnetic wave scattering from random rough surfaces and layers.
Christophe Bourlier works at the IETR (Institut d'Electronique et de Telecommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) and is also a Researcher at the French National Center for Scientific Research (CNRS) on electromagnetic wave scattering from rough surfaces and objects for remote sensing applications and radar signatures. He is the author of more than 160 journal articles and conference papers.

Dr. Nicolas Pinel is PhD in the Radar team of IREENA Laboratory at University of? Nantes Angers Le Mans, France. Christophe Bourlier is works at IREENA (Institut de Recherche en Electrotechnique et Electronique de Nantes Atlantique, France) Laboratory, University of Nantes, France.

Erscheint lt. Verlag 30.11.2013
Verlagsort New York
Sprache englisch
Maße 188 x 233 mm
Gewicht 1442 g
Themenwelt Naturwissenschaften Physik / Astronomie Elektrodynamik
Technik Elektrotechnik / Energietechnik
ISBN-10 1-118-57915-1 / 1118579151
ISBN-13 978-1-118-57915-2 / 9781118579152
Zustand Neuware
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