Particle Induced Electron Emission I
Seiten
2013
|
1. Softcover reprint of the original 1st ed. 1991
Springer Berlin (Verlag)
978-3-662-14999-7 (ISBN)
Springer Berlin (Verlag)
978-3-662-14999-7 (ISBN)
This monograph discusses collision-induced electron emission from nearly free-electron metals by ion or electron impact. This subject is, as is well known, of acute importance in understanding plasma-wall interactions in thermonuclear reactors. It is also the basis for one of the most exciting technological developments of the last few years - scanning electron miscroscopy. Several electron excitation mechanisms of electrons in the target are considered: excitation of single conduction and core electrons, excitation by plasmon decay and by Auger processes. Transport of inner excited electrons is simulated by the Boltzmann equation incorporating both elastic and inelastic collisions. The numerical calculation of scattering rates uses a dynamically screened Coulomb interaction. These results for the energy distributions of emerging electrons as well as the electron yield are compared with recent experimental measurements on electron emission from polycrystalline aluminum.
Collision-induced electron emission is, as is well known, of acute importance in understanding plasma-wall interactions in thermonuclear reactors. It is also the basis for one of the most exciting technological developments of the last few years - scanning electron miscroscopy. In this book the physics of the underlying processes is discussed in detail. Theoretical results are compared with recent experimental data.
Theory of electron emission from nearly-free-electron metals by proton and electron bombardment.- Theoretical description of secondary electron emission induced by electron or ion beams impinging on solids.
Erscheint lt. Verlag | 3.10.2013 |
---|---|
Reihe/Serie | Springer Tracts in Modern Physics |
Co-Autor | Max Rösler, Wolfram Brauer, Jacques Devooght, Jean-Claude Dehaes, Alain Dubus, Michel Cailler, Jean-Pierre Ganachaud |
Zusatzinfo | IX, 137 p. 5 illus. in color. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 237 g |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik | |
Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
Technik ► Maschinenbau | |
Schlagworte | Crystal • electron • electron spectroscopy • Electron yield • Elektronenausbeute • Elektronenemission • Elektronenspektroskopie • Microscopy • PR • protoneninduzierte Elektronenemission • Proton-induced electron emission • scanning microscopy • Scanningmikroskopie • scattering • Secondary electron emission • Sekundärelektronenemission • spectroscopy • Teilchenphysik • Transport |
ISBN-10 | 3-662-14999-0 / 3662149990 |
ISBN-13 | 978-3-662-14999-7 / 9783662149997 |
Zustand | Neuware |
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