Particle Induced Electron Emission I

Particle Induced Electron Emission I

Buch | Softcover
IX, 137 Seiten
2013 | 1. Softcover reprint of the original 1st ed. 1991
Springer Berlin (Verlag)
978-3-662-14999-7 (ISBN)
53,49 inkl. MwSt
This monograph discusses collision-induced electron emission from nearly free-electron metals by ion or electron impact. This subject is, as is well known, of acute importance in understanding plasma-wall interactions in thermonuclear reactors. It is also the basis for one of the most exciting technological developments of the last few years - scanning electron miscroscopy. Several electron excitation mechanisms of electrons in the target are considered: excitation of single conduction and core electrons, excitation by plasmon decay and by Auger processes. Transport of inner excited electrons is simulated by the Boltzmann equation incorporating both elastic and inelastic collisions. The numerical calculation of scattering rates uses a dynamically screened Coulomb interaction. These results for the energy distributions of emerging electrons as well as the electron yield are compared with recent experimental measurements on electron emission from polycrystalline aluminum.

Collision-induced electron emission is, as is well known, of acute importance in understanding plasma-wall interactions in thermonuclear reactors. It is also the basis for one of the most exciting technological developments of the last few years - scanning electron miscroscopy. In this book the physics of the underlying processes is discussed in detail. Theoretical results are compared with recent experimental data.

Theory of electron emission from nearly-free-electron metals by proton and electron bombardment.- Theoretical description of secondary electron emission induced by electron or ion beams impinging on solids.

Erscheint lt. Verlag 3.10.2013
Reihe/Serie Springer Tracts in Modern Physics
Co-Autor Max Rösler, Wolfram Brauer, Jacques Devooght, Jean-Claude Dehaes, Alain Dubus, Michel Cailler, Jean-Pierre Ganachaud
Zusatzinfo IX, 137 p. 5 illus. in color.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 237 g
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik Maschinenbau
Schlagworte Crystal • electron • electron spectroscopy • Electron yield • Elektronenausbeute • Elektronenemission • Elektronenspektroskopie • Microscopy • PR • protoneninduzierte Elektronenemission • Proton-induced electron emission • scanning microscopy • Scanningmikroskopie • scattering • Secondary electron emission • Sekundärelektronenemission • spectroscopy • Teilchenphysik • Transport
ISBN-10 3-662-14999-0 / 3662149990
ISBN-13 978-3-662-14999-7 / 9783662149997
Zustand Neuware
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