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Advances in Imaging and Electron Physics

Buch | Hardcover
420 Seiten
1996
Academic Press Inc (Verlag)
978-0-12-014739-7 (ISBN)
185,80 inkl. MwSt
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This volume features articles on the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

R. Navarro, A. Tabernero, and G. Cristobal, Image Representaton with Gabor Wavelets and Its Applications. L. Bedini, I. Gerace, E. Salerno, and A. Tonazzini, Models and Algorithms for Edge-Preserving Image Reconstruction. E.A.B. da Silva and D.G. Sampson, Successive Approximation Wavelet Vector Quantization for Image and Video Coding. R. Jagannathan and S.A. Khan, Quantum Theory of the Optics of Charged Particles. J. Ximen, Ultrahigh-Order Canonical Aberration Calculation and Integration Transformation in Rotationally Symmetric Magnetic and Electrostatic Lenses. Appendix. Chapter References. Subject Index.

Erscheint lt. Verlag 2.12.1996
Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Chef-Herausgeber: Peter W. Hawkes
Herausgeber (Serie): Tom Mulvey, Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 790 g
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Naturwissenschaften Physik / Astronomie Optik
Technik
ISBN-10 0-12-014739-4 / 0120147394
ISBN-13 978-0-12-014739-7 / 9780120147397
Zustand Neuware
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