Advances in Acoustic Microscopy -

Advances in Acoustic Microscopy

Andrew Briggs (Herausgeber)

Buch | Softcover
350 Seiten
2012 | Softcover reprint of the original 1st ed. 1995
Springer-Verlag New York Inc.
978-1-4613-5762-9 (ISBN)
53,49 inkl. MwSt
In 1992 Acoustic Microscopy was published by Oxford University Press, in the series of Monographs on the Physics and Chemistry of Materials. Reviews appeared in the Journal of Microscopy [169 (1), 91] and in Contemporary Physics [33 (4), 296]. At the time of going to press, it seemed that the field of acoustic microscopy had settled down from the wonderful developments in resolution that had been seen in the late seventies and the early eighties and from the no less exciting developments in quantitative elastic measurements that had followed. One reviewer wrote, "The time is ripe for such a book, now that the expansion of the subject has perceptively slowed after it was detonated by Lemons and Quate. " [A. Howie, Proc. RMS 27 (4), 280]. In many ways, this remains true. The basic design for both imaging and quantitative instruments is well-established; the upper frequency for routine imaging is the 2 GHz established by the Ernst Leitz scanning acoustic microscope (ELSAM) in 1984. For the most accurate V(z) measurements, the 225-MHz line-focus-beam lens, developed at Tohoku Univer­ sity a little before then, remains standard. The principles of the contrast theory have been confirmed by abundant experience; in particular the role of surface acoustic waves, such as Rayleigh waves, dominates the contrast in most high­ resolution studies of many materials.

1. Acoustic Microscopy Analysis of Microelectronic Interconnection and Packaging Technologies.- 1.1. Introduction.- 1.2. Ceramic Packages.- 1.3. Plastic IC Packages.- 1.4. Die Attach.- 1.5. Multilayer Interconnect.- 1.6. Tape Automated Bonding.- 1.7. Mechanical Properties.- 1.8. Future Perspectives.- 1.9. Conclusions.- Acknowledgments.- References.- 2. Measuring Short Cracks by Time-Resolved Acoustic Microscopy.- 2.1. Introduction.- 2.2. Short-Pulse System for the SAM.- 2.3. Time-Resolved Measurement Technique.- 2.4. Crack Depth Measurements in Plastic Material.- 2.5. Applying TOFD to Metals.- 2.6. Crack Growth Measurement.- 2.7. Discussion.- 2.8. Summary.- Acknowledgments.- References.- 3. Probing Biological Cells and Tissues with Acoustic Microscopy.- 3.1. Introduction.- 3.2. Probing Cells in Culture.- 3.3. Probing Microspheres and Freshly Isolated Outer Hair Cells.- 3.4. Bone and Other Collagenous Tissues.- 3.5. Model Investigations of Gels and Membranes.- 3.6. Conclusions.- Acknowledgments.- References.- 4. Lens Geometries for Quantitative Acoustic Microscopy.- 4.1. Introduction.- 4.2. Acoustic Lens Geometries.- 4.3. Comparison of Signal Processing Electronics.- 4.4. The V(f) Characterization Method.- 4.5. Accuracy of Velocity Measurement Using the V(z) Method..- 4.6. Conclusions.- Acknowledgments.- References.- 5. Measuring Thin-Film Elastic Constants by Line-Focus Acoustic Microscopy.- 5.1. Overview.- 5.2. Introduction.- 5.3. Measurement Model for V(z) Curves.- 5.4. Measuring and Calculating SAW Velocities.- 5.5. Inverse Method.- 5.6. Elastic Constants of Single-Layer Films.- 5.7. Effective Elastic Constants of Superlattices.- 5.8. Conclusion.- Acknowledgment.- References.- 6. Measuring the Elastic Properties of Stressed Materials by Quantitative Acoustic Microscopy.- 6.1. Introduction.- 6.2. Acoustoelasticity and Surface Waves.- 6.3. Line-Focus Beam Acoustic Microscopy.- 6.4. Determining Materials Properties.- 6.5. Examples.- 6.6. Conclusions.- Acknowledgments.- References.- 7. Surface Brillouin Scattering—Extending Surface Wave Measurements to 20 GHz.- 7.1. Introduction.- 7.2. Kinematics of Brillouin Scattering.- 7.3. Theory of Brillouin-Scattering Cross Section.- 7.4. Surface Brillouin Scattering Setup.- 7.5. Experimental Results.- 7.6. Conclusions.- Acknowledgments.- References.- 8. New Approaches in Acoustic Microscopy for Noncontact.- Measurement and Ultrahigh Resolution.- 8.1. Introduction.- 8.2. Phase Velocity Scanning Method.- 8.3. Atomic Force Microscopy (AFM) with a Vibrating Sample.- Acknowledgement.- References.

Reihe/Serie Advances in Acoustic Microscopy ; 1
Zusatzinfo XXXI, 350 p.
Verlagsort New York, NY
Sprache englisch
Maße 152 x 229 mm
Themenwelt Naturwissenschaften Biologie Allgemeines / Lexika
Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Geowissenschaften Mineralogie / Paläontologie
Naturwissenschaften Physik / Astronomie Angewandte Physik
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Naturwissenschaften Physik / Astronomie Thermodynamik
Technik Maschinenbau
ISBN-10 1-4613-5762-4 / 1461357624
ISBN-13 978-1-4613-5762-9 / 9781461357629
Zustand Neuware
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