Analog IC Reliability in Nanometer CMOS
Seiten
2013
Springer-Verlag New York Inc.
978-1-4614-6162-3 (ISBN)
Springer-Verlag New York Inc.
978-1-4614-6162-3 (ISBN)
This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.
The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.
The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Introduction.- CMOS Reliability Overview.- Transistor Aging Compact Modeling.- Background on IC Reliability Simulation.- Analog IC Reliability Simulation.- Integrated Circuit Reliability.- Conclusions.
| Reihe/Serie | Analog Circuits and Signal Processing |
|---|---|
| Zusatzinfo | XVI, 198 p. |
| Verlagsort | New York, NY |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| Schlagworte | Analog Circuits and Signal Processing • Analog integrated circuits • Failure-resilient Analog Circuit Design • Reliability in Analog Integrated Circuits • Reliability in Nanometer CMOS • Transistor Aging Effects on Circuit Reliability |
| ISBN-10 | 1-4614-6162-6 / 1461461626 |
| ISBN-13 | 978-1-4614-6162-3 / 9781461461623 |
| Zustand | Neuware |
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