Semiconducting Silicides - Victor E. Borisenko

Semiconducting Silicides

Basics, Formation, Properties
Buch | Hardcover
XVI, 348 Seiten
2000 | 1., Aufl.
Springer Berlin (Verlag)
978-3-540-66111-5 (ISBN)
179,71 inkl. MwSt
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The book gives a comprehensive presentation and analysis of properties and methods of formation of semiconducting silicides. Fundamental electronic, optical and transport properties of the silicides collected from recent publications will help the reader to make a choice for their application in new generations of solid-state devices. A comprehensive presentation of thermodynamic and kinetic data is given in combination with their technical application. Information on corresponding thin-film or bulk crystal formation techniques is provided. TOC:General Material Aspects.- Thin Film Silicide Formation.- Crystal Growth.- Fundamental Electronic Properties.- Transport Properties.- Optical Properties.- Thermoelectric Properties.

Victor E. Borisenko graduated in 1973 from the Belarusian State University of Informatics and Radioelectronics (BSUIR) as an engineer in semiconductor electronics. He received his first doctorate in physics and mathematics in 1980, his second one in 1988. Since 1990, he has held positions as a professor in many universities worldwide, including the University of Salford in England, the University of Wuppertal in Germany and the University of Electro-Communications in Tokyo, Japan. He now holds a chair as professor and vice-rector of BSUIR and acts as supervisor of the Interuniversity Center of Nanoelectronics and Novel Materials. Since 1995, Professor Borisenko organizes the international conference on physics, chemistry and applications of nanostructures `Nanomeeting? His research team focuses on fundamental electronic and optical properties of semiconducting silicides and low dimensional silicon based nanostructures, carrier transport in semiconductor/dielectric multiquantum wells and DNA, design of novel nanoelectronics and nanophotonic devices, quantum computing.

Reihe/Serie Springer Series in Materials Science ; 39
Sprache englisch
Maße 155 x 235 mm
Gewicht 580 g
Einbandart gebunden
Themenwelt Technik Maschinenbau
Schlagworte Halbleiter • HC/Technik/Maschinenbau, Fertigungstechnik • Materials properties • Materials Science • semiconductors • Silicides • Silicium • Silicium / Silizium
ISBN-10 3-540-66111-5 / 3540661115
ISBN-13 978-3-540-66111-5 / 9783540661115
Zustand Neuware
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