Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Buch | Hardcover
440 Seiten
2012
Academic Press Inc (Verlag)
978-0-12-394297-5 (ISBN)
209,95 inkl. MwSt
Features articles on the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This title provides information and updates the developments in the field.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

Thermal Imaging in Medicine
Lila Iznita Izhar and Maria Petrou

Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
Jean-Michel Tualle

Imaging Mass Spectrometry – Sample Preparation, Instrumentation and Applications
Kamlesh Shrivas and Mitsutoshi Setou

Transformation Optics
Robert T. Thompson and Steven A. Cummer

TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
Tobias Klein, Egbert Buhr and Carl Georg Frase

Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics

M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah

Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 790 g
Themenwelt Naturwissenschaften Physik / Astronomie Angewandte Physik
Naturwissenschaften Physik / Astronomie Optik
Technik Maschinenbau
ISBN-10 0-12-394297-7 / 0123942977
ISBN-13 978-0-12-394297-5 / 9780123942975
Zustand Neuware
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