Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Buch | Hardcover
266 Seiten
2011
Academic Press Inc (Verlag)
978-0-12-385981-5 (ISBN)
219,95 inkl. MwSt
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin
Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa
Introduction of a Quantum of Time (/chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy – Ruy H. A Farias and Erasmo RECAMI
Superresolution Imaging – Revisited - Markus E. Testorf
Methods and Limitations of Subwavelength Imaging Andrew Neice

Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 520 g
Themenwelt Naturwissenschaften Physik / Astronomie Angewandte Physik
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Elektrodynamik
Technik Maschinenbau
ISBN-10 0-12-385981-6 / 0123859816
ISBN-13 978-0-12-385981-5 / 9780123859815
Zustand Neuware
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