Advances in Imaging and Electron Physics

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach
LucaGeretti, AntonioAbramo

Logarithmic Image Processing for Color Images
M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography
Rainer A. Leitgeb

Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy
S.A. Nepijko, G. Schönhense

Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging
Chad M. Parish

Aberration Correctors developed under Triple C Project
Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

Spatially resolved thermoluminescence in a scanning electron microscope

T. Schulz, M. Albrecht, K.Irmscher