Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Buch | Hardcover
360 Seiten
2011
Academic Press Inc (Verlag)
978-0-12-385985-3 (ISBN)
219,95 inkl. MwSt
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

A History Of Cameca
Emmanuel de Chambost

Theory and Applications of General Adaptive Neighborhood Image Processing
Johan Debayle, Jean-Charles Pinoli

Shape Recognition Based on Eigenvalues of the Laplacian
M. Ben Haj Rhouma, M.A. Khabou, L. Hermi

Point Set Analysis
Nicolas Lomenie, Georges Stamon

Image recovery from sparse samples, discrete sampling theorem and sharply bounded band limited discrete signals

Leonid P. Yaroslavsky

Erscheint lt. Verlag 25.8.2011
Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 620 g
Themenwelt Naturwissenschaften Physik / Astronomie Angewandte Physik
Naturwissenschaften Physik / Astronomie Hochenergiephysik / Teilchenphysik
Technik
ISBN-10 0-12-385985-9 / 0123859859
ISBN-13 978-0-12-385985-3 / 9780123859853
Zustand Neuware
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