Mechanical Properties of Nanocrystalline Materials
Pan Stanford Publishing Pte Ltd (Verlag)
978-981-4241-97-7 (ISBN)
This book concentrates on both understanding and development of nanocrystalline materials. The original relation which connects grain size and strength known as the Hall-Petch relation is studied in the nanometer grain size region. The breakdown of such a relation is a challenge. Why and how to overcome? Is the dislocation mechanism still operating when the grain size is very small approaching the amorphous limit? How do we go from the microstructure information to the continuum description of the mechanical properties.
James C. M. Li is professor of mechanical engineering and of materials science at Rochester University. James has published numerous papers and won many distinguished awards, including the Albert Easton White Distinguished Teacher Award.
Foreword, Preface, Chapter 1: Mechanisms Governing the Plastic Deformation of Nanocrystalline Materials, Including Grain-Size Softening, Chapter 2: Enhanced Mechanical Properties of Nanostructured Metals Produced by SPD Techniques, Chapter 3: Strength and Strain-Rate Sensitivity of Nanopolycrystals, Chapter 4: A Composite Model of Nanocrystalline Materials, Chapter 5: The Effect of Microstructural Features on the Mechanical Properties of Nanocrystalline Metals, Chapter 6: Mechanical Behavior and Deformation Mechanism of FCC Metals With Nanoscale Twins, Chapter 7: Grain Boundaries in Nanocrystalline Materials, Chapter 8: Dynamic Mechanical Behavior of Ultrafine and Nanocrystalline Refractory Metals, Chapter 9: Fracture Behavior of Nanocrystalline Ceramics, Chapter 10: On Challenging Problems in Bridging the Scales From the Atomistic to the Continuum
Erscheint lt. Verlag | 31.10.2011 |
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Zusatzinfo | 39 Illustrations, color; 116 Illustrations, black and white |
Verlagsort | Singapore |
Sprache | englisch |
Maße | 152 x 229 mm |
Gewicht | 580 g |
Themenwelt | Technik |
ISBN-10 | 981-4241-97-0 / 9814241970 |
ISBN-13 | 978-981-4241-97-7 / 9789814241977 |
Zustand | Neuware |
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