An External Interface for Processing 3-D Holographic and X-Ray Images
Springer Berlin (Verlag)
978-3-540-50822-9 (ISBN)
1 Introduction.- 1.1 General objectives of ESPRIT project 898.- 1.2 Size and extent of ESPRIT project 898.- 1.3 Roles of the partners of ESPRIT project 898.- 2 Aim of ESPRIT project 898.- 2.1 Holographic interferometry and X-ray radiography: complementary methods.- 2.2 Combined holographic interferometry and X-ray radiography.- 2.3 Architecture of the external interface system.- 3 Deformation measurement by holographic interferometry.- 3.1 Theoretical foundations of holographic interferometry.- 3.2 Structures to be tested holographically.- 3.3 Loading of the structures.- 3.4 Quantitative evaluation of holographic interference patterns.- 3.5 Techniques of quantitative holographic interferometry.- 3.6 Evaluation of holographic interference patterns by the phase step method.- 3.7 Evaluation of holographic interference patterns by the Fourier-transform method.- 3.8 References.- 4 Structural and stress analysis.- 4.1 Analysis methods.- 4.2 The Finite Element program MELINA.- 4.3 Interpolation of holographic data.- 4.4 Software for interpolation and verification.- 4.5 Data formaf for representation of holographic images.- 4.6 Preparation for analysis.- 4.7 Analysis of honeycomb panel.- 5 Component inspection by X-ray radiography.- 5.1 Introduction to X-ray radiography.- 5.2 X-ray inspection system hardware.- 5.3 X-ray inspection system software.- 5.4 Summary.- 5.5 Appendix: Tabulated results of conformity tests.- 6 Microfocus X-ray testing.- 6.1 Theory of microfocus system.- 6.2 The automatic non-destructive testing system description.- 6.3 The microprocessor controlled microfocus.- 6.4 Operation.- 6.5 Technical description of the manipulator.- 6.6 Test of the system.- 6.7 Conclusion.- 7 Conclusions and future prospects.
Erscheint lt. Verlag | 10.5.1989 |
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Reihe/Serie | Project 898. PHOX | Research Reports Esprit |
Zusatzinfo | IX, 147 p. 38 illus. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 170 x 244 mm |
Gewicht | 315 g |
Themenwelt | Informatik ► Weitere Themen ► CAD-Programme |
Technik ► Elektrotechnik / Energietechnik | |
Schlagworte | Architecture • Bildverarbeitung • Control • Deformation • Helium-Atom-Streuung • Measurement • microprocessor • non-destructive testing • Qualitätssicherung • REM • Sensor • Sensoren • sensors • stem • Strukturanalyse • X-Ray • zerstörungsfreie Prüfverfahren |
ISBN-10 | 3-540-50822-8 / 3540508228 |
ISBN-13 | 978-3-540-50822-9 / 9783540508229 |
Zustand | Neuware |
Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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