Passive RF Integrated Circuits
Modeling, Characterization and Measurement
Seiten
2009
ISTE Ltd and John Wiley & Sons Inc (Verlag)
978-1-84821-175-9 (ISBN)
ISTE Ltd and John Wiley & Sons Inc (Verlag)
978-1-84821-175-9 (ISBN)
This book, written by recognized experts in the field, is intended for designers of RF or microwave passive integrated circuits. It describes methods used for modeling passive circuits using the most common numerical analysis techniques (the method of moments, finite element methods, FDTD, TLM), and pays particular attention to propagation phenomena. Interconnections and packaging modeling are included, as well as an original method for multi-scale circuit modeling. Characterization and measurement methods in the time and frequency domains are the subject of two very detailed chapters. Measurement errors using Vector Network Analyzer (VNA ) and appropriate corrections are detailed and the divergences between all the various parameters S, Z, Y, h, T, ABCD are given. Time domain reflectometry and its use are also covered in detail.
Pierre Saguet is Professor at the Ecole Nationale Supérieure d'Electronique de Grenoble, France, and manager of the electromagnetic modeling team in the IMEP-LAHC laboratory.
Verlagsort | London |
---|---|
Sprache | englisch |
Maße | 163 x 241 mm |
Gewicht | 553 g |
Einbandart | gebunden |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
Technik ► Nachrichtentechnik | |
ISBN-10 | 1-84821-175-9 / 1848211759 |
ISBN-13 | 978-1-84821-175-9 / 9781848211759 |
Zustand | Neuware |
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