Atomic Force Microscopy - Peter Eaton, Paul West

Atomic Force Microscopy

, (Autoren)

Buch | Hardcover
256 Seiten
2010
Oxford University Press (Verlag)
978-0-19-957045-4 (ISBN)
155,85 inkl. MwSt
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM. Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.

1. Introduction ; 2. Instrumental Aspects of AFM ; 3. AFM Modes ; 4. Measuring AFM Images ; 5. Image Processing in AFM ; 6. Image Artifacts in AFM ; 7. Applications of AFM ; Appendix 1: AFM Standards and Calibration Specimens ; Appendix 2: AFM Software

Erscheint lt. Verlag 25.3.2010
Zusatzinfo 150 b/w line and halftone illustrations, 9 colour figures
Verlagsort Oxford
Sprache englisch
Maße 174 x 256 mm
Gewicht 660 g
Themenwelt Naturwissenschaften Geowissenschaften Mineralogie / Paläontologie
Naturwissenschaften Physik / Astronomie Festkörperphysik
Naturwissenschaften Physik / Astronomie Thermodynamik
Technik Maschinenbau
ISBN-10 0-19-957045-0 / 0199570450
ISBN-13 978-0-19-957045-4 / 9780199570454
Zustand Neuware
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