Fault Tolerance and Yield Improvement of Embedded Memories

Recent advances in microelectronics industry allow us
to create a System-On-Chip. The embedded memory is
one of the vital parts of any system-on-chip. Today
it is not enough just to design and fabricate the
embedded memory. In order to put the System-On-Chip
in mass production, the designer has to be concerned
about yield and reliability of the embedded memory.
This book provides background on fault tolerance
improvement theory, and gives several new solutions
on how to improve reliability and enhance yield of
the embedded memory in efficient ways.
The work incorporates two novel circuits
that significantly improve embedded memory yield and
reliability.
This book should prove useful to engineers,
researchers, professionals wishing to be up to date
with the recent advancements in embedded and high
density memory design. It also can be used as a
supplementary material for a graduate-level course on
VLSI embedded memory.