Noncontact Atomic Force Microscopy
Springer Berlin (Verlag)
978-3-642-01494-9 (ISBN)
Introduction.- Method for Precise Force Measurements.- Force Spectroscopy on Semiconductors.- Tip-sample Interactions as a Function of Distance on Insulating Surfaces.- Imaging and Force Spectroscopy on Layered Materials.- Principles and Applications of the qPlus Sensor.- Atomic Resolution Imaging and Site-Specific Spectroscopy on Model Catalyst.- Atom Manipulation on Semiconductor Surfaces.- Atomic Manipulation on Metal Surfaces.- Atom Manipulation on Insulator Surfaces.- Simulations on Atomic Manipulation on Semiconductor Surfaces.- Multi-Scale Modeling of NC-AFM Imaging and Controlling Atomic Dynamics at Insulating Surfaces.- Magnetic Exchange Force Microscopy.- Frequency Modulation Atomic Force Microscopy in Liquids.- Biological Applications of FM-AFM for Liquid Environment.- Low Amplitude High-Frequency Imaging with Deflection and Torsion of the Cantilever in Vacuum and Liquid.- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.-
| Erscheint lt. Verlag | 1.10.2009 |
|---|---|
| Reihe/Serie | NanoScience and Technology |
| Zusatzinfo | XVIII, 401 p. 105 illus., 77 illus. in color. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 868 g |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| Technik ► Maschinenbau | |
| Schlagworte | Atomic and molecular imaging • Atomic scale magnetic imaging • Chemical identification • Force spectroscopy and mapping • liquid • Microscopy • Mikroskopie • Modeling • nanotechnology • spectroscopy • Tuning fork |
| ISBN-10 | 3-642-01494-1 / 3642014941 |
| ISBN-13 | 978-3-642-01494-9 / 9783642014949 |
| Zustand | Neuware |
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