Analytical and Numerical Studies of Defect Formation in SiC
Seiten
2009
VDM Verlag Dr. Müller
978-3-639-12094-3 (ISBN)
VDM Verlag Dr. Müller
978-3-639-12094-3 (ISBN)
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Improvement of PVT (Physical Vapor Transport) grown
SiC (Silicon Carbide) structural quality is crucial
for the wide commercialization of SiC electronic
devices that feature superior characteristics for
power conditioning and control. This is why, this
publication is devoted to investigation and
development of comprehensive models that can help to
explain, understand and, then, eliminate
formation of various defects in SiC during PVT
growth.
SiC (Silicon Carbide) structural quality is crucial
for the wide commercialization of SiC electronic
devices that feature superior characteristics for
power conditioning and control. This is why, this
publication is devoted to investigation and
development of comprehensive models that can help to
explain, understand and, then, eliminate
formation of various defects in SiC during PVT
growth.
EDUCATION: Ph.D. in Electrical Engineering, May 2002, UNIVERSITY
OF SOUTH CAROLINA, Columbia, SC 29208, USA.
PROFESSIONAL INTERESTS: Analytical, numerical and experimental
studies of SiC PVT grown; Investigation of defect formation
during SiC growth; Fabrication and design optimization of noval
SiC PVT growth reactors.
Sprache | englisch |
---|---|
Maße | 150 x 12 mm |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
ISBN-10 | 3-639-12094-9 / 3639120949 |
ISBN-13 | 978-3-639-12094-3 / 9783639120943 |
Zustand | Neuware |
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Buch | Hardcover (2023)
Hanser (Verlag)
49,99 €