Advances in X-Ray Analysis

I. Accuracy in X-ray Powder Diffraction.- Accuracy in Angle and Intensity Measurements in X-Ray Powder Diffraction.- Precision Lattice Parameter Measurements with Guinier Camera and Counter Diffractometer: Comparison and Reconciliation of Results.- Effects of Diffractometer Alignment and Aberrations on Peak Positions and Intensities.- Accuracy and Precision of Intensities in X-Ray Polycrystalline Diffraction.- New Standard Reference Materials for X-Ray Powder Diffraction.- Precision and Reproducibility of Lattice Parameters from Guinier Powder Patterns: Follow-up and Assessment.- II. Search/Match Procedures, Powder Diffraction File.- POWDER-PATTERN: A System of Programs for Processing and Interpreting Powder Diffraction Data.- An Evaluation of Some Profile Models and the Optimization Procedures Used in Profile Fitting.- Computer-Aided Qualitative X-Ray Powder Diffraction Phase Analysis.- The JCPDS Data Base — Present and Future.- Search/Match Implications of the Frequency Distribution of “d” Values in the JCPDS Powder Data File.- Computer Search/Match of Standards Containing a Small Number of Reflections.- Comparison of the Hanawalt and Johnson-Vand Computer Search/Match Strategies.- III. Quantitative XRD Analysis.- A Comparison of Methods for Reducing Preferred Orientation.- The Dramatic Effect of Crystallite Size on X-Ray Intensities.- X-Ray Diffraction Intensity of Oxide Solid Solutions: Application to Qualitative and Quantitative Phase Analysis.- Quantitative Analys is of Platelike Pigments by X-Ray Diffraction.- Preparation and Certification of Standard Reference Materials to be Used in the Determination of Retained Austenite in Steels.- Profile Fitting for Quantitative Analysis in X-Ray Powder Diffraction.- XRD Quantitative Phase Analysis Using theNBS*QUANT82 System.- SCRIP - Fortran IV Software for Quantitative XRD.- IV. XRD Applications and Automation.- An X-Ray Diffraction Study of CaNi5 Hydrides Using In Situ Hydriding and Profile Fitting Methods.- The Measurement of Thermally Induced Structural Changes by High Temperature (900°C) Guinier X-Ray Powder Diffraction Techniques.- The Use of X-Ray Diffraction and Infrared Spectroscopy to Characterize Hazardous Wastes.- Comparison of X-Ray Powder Diffraction Techniques.- The Use of Multi-Scan Diffraction in Phase Identification.- An Automated X-Ray Diffractometer for Detection and Identification of Minor Phases.- Time Share Computer Capability for Phase Identification by X-Ray Diffraction.- V. X-Ray Stress Determination, Position Sensitive Detectors, Fatigue and Fracture Characterization.- The Use of Mn-K? X-Rays and a New Model of PSPC in Stress Analysis of Stainless Steel.- Measurement of Stress Gradients by X-Ray Diffraction.- A Method for X-Ray Stress Analysis of Thermochemically Treated Materials.- Application of a Position Sensitive Scintillation Detector for Nondestructive Residual Stress Measurements Inside Stainless Steel Piping.- On the X-Ray Diffraction Method of Measurement of Triaxial Stresses with Particular Reference to the Angle 2?o.- Direct Determination of Stress in a Thin Film Deposited on a Single-Crystal Substrate from an X-Ray Topographic Image.- The Determination of Elastic Constants Using a Combination of X-Ray Stress Techniques.- One-Dimensional, Curved, Position-Sensitive Detector for X-Ray Diffractometry.- A Phi-Psi-Diffractometer for Residual Stress Measurements.- X-Ray Fractography on Fatigue Fractured Surface.- X-Ray Diffraction Observation of Fracture Surfaces of Ductile Cast Iron.- Analytical and Experimental Investigation ofFlow and Fracture Mechanisms Induced by Indentation in Single Crystal MgO.- X-Ray Diffraction Study of Shape Memory in Uranium-Niobium Alloys.- VI. New XRF Instrumentation and Techniques.- X-Ray Fluorescence Analysis Using Synchrotron Radiation..- Energy Resolution Measurements of Mercuric Iodide Detectors Using a Cooled FET Preamplifier.- X-Ray Polarization: Bragg Diffraction and X-Ray Fluorescence.- A New Technique for Radioisotope-Excited X-Ray Fluorescence.- Bragg-Borrmann X-Ray Spectroscopy from a Line Source 341.- VII. XRF Computer Systems and Mathematical Corrections.- Automated Qualitative X-Ray Fluorescence Elemental Analysis.- A New Method for Quantitative X-Ray Fluorescence Analysis of Mixtures of Oxides or Other Compounds by Empirical Parameter Methods.- FPT: An Integrated Fundamental Parameters Program for Broadband EDXRF Analysis Without a Set of Similar Standards.- A Comparison of the XRF11 and EXACT Fundamental Parameters Programs When Using Filtered Direct and Secondary Target Excitation in EDXRF.- A Generalized Matrix Correction Approach for Energy- Dispersive X-Ray Fluorescence Analysis of Paint Using Fundamental Parameters and Scattered Silver K? Peaks.- Multielement Analysis of Unweighed Biological and Geological Samples Using Backscatter and Fundamental Parameters.- A Correction Method for Absorption in the Analysis of Aerosols by EDX Spectrometry.- XRF Analysis by Combining the Standard Addition Method with Matrix-Correction Models.- Accurate Geochemical Analysis of Samples of Unknown Composition.- VIII. XRF General Applications.- XRF Analysis of Vegetation Samples and Its Application to Mineral Exploration.- Application of XRF to Measure Strontium in Human Bone In Vivo.- Determination of Boron Oxide in Glass by X-Ray Fluorescence Analysis.-Measurement of Composition and Thickness for Single Layer Coating with Energy Dispersive XRF Analysis.- Determination of Light Elements on the Chem-X Multichannel Spectrometer.- Simultaneous Determination of 36 Elements by X-Ray Fluorescence Spectrometry as a Prospecting Tool.- Elemental Analysis of Geological Samples Using a Multichannel, Simultaneous X-Ray Spectrometer.- Chemical Analysis of Coal by Energy Dispersive X-Ray Fluorescence Utilizing Artificial Standards.- Author Index.