Advances in Imaging and Electron Physics (eBook)

front cover 1
copyright 5
table of contents 6
Contributors 8
Preface 9
Future Contributions 11
Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement 16
I. OVERVIEW OF PDE-BASED PROCESSES 18
II. SHARPENING BY THE AXIOMATIC APPROACH 36
III. SHARPENING BY THE VARIATIONAL APPROACH 61
IV. COMPLEX DIFFUSION PROCESSES 76
V. TEXTURE-PRESERVING DENOISING 102
VI. CONCLUSION 118
REFERENCES 119
The S-State Model for Electron Channeling in High-Resolution Electron Microscopy 125
I. INTRODUCTION 127
II. THE CHANNELING THEORY 138
III. CALCULATION OF THE EIGENFUNCTIONS OF AN ELECTRON IN ANISOLATED ATOM COLUMN 144
IV. THE S-STATE MODEL 174
V. THE S-STATE MODEL FOR NONISOLATED ATOM COLUMNS 189
VI. THE S-STATE MODEL IN CASE OF CRYSTAL OR BEAM TILT 205
VII. EXPERIMENTAL CHANNELING MAPS 215
APPENDIX A. THE MEAN ATOM COLUMN POTENTIAL 232
APPENDIX B. THE TWO-DIMENSIONAL QUANTUMHARMONIC OSCILLATOR 234
ACKNOWLEDGMENTS 237
REFERENCES 237
Measurement of Electric Fields on Object Surface in an Emission Electron Microscope 241
I. INTRODUCTION 242
II. DIRECT AND INVERSE PROBLEMS OF MEASUREMENT OF ELECTRICFIELDS (POTENTIAL) ON THE OBJECT SURFACE IN EMISSION ELECTRONMICROSCOPE 244
III. MODEL EXPERIMENTS ON MAPPING OF ELECTRIC FIELDS(POTENTIAL) ON THE OBJECT SURFACE USING AN EMISSIONELECTRON MICROSCOPE 266
IV. THE EFFECT OF THE LOCAL FIELDS AND MICROROUGHNESS AT THEOBJECT ON THE IMAGING AND RESOLVING POWER OF AN EMISSIONELECTRON MICROSCOPE 276
V. PRACTICAL APPLICATIONS OF MICROFIELD MEASUREMENT USINGAN EMISSION ELECTRON MICROSCOPE 292
VI. MEASUREMENT OF OBJECT SURFACE GEOMETRY (RELIEF) WITH ANEMISSION ELECTRON MICROSCOPE 305
VII. CONCLUSIONS 326
REFERENCES 327
Index 331