Waveguide Spectroscopy of Thin Films (eBook)
236 Seiten
Elsevier Science (Verlag)
978-0-08-045789-5 (ISBN)
This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties.
? There are new techniques of measurement of thin-film parameters stated
In Waveguide Spectroscopy of Thin Films new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. - There are new techniques of measurement of thin-film parameters stated
Cover 1
Thin Films and Nanostructures 4
Dedication 6
Contents 8
Waveguide Spectroscopy of Thin Films 12
Foreword 14
Acknowledgments 16
Introduction 18
Interaction of Light with Matter 22
Power States in Solids 22
Macroscopic Aspects of Solids 29
Spectroscopy of Optical Guided Modes 38
Waveguide Properties of Thin Films and Surface Layers 38
Reflection of the Plane Wave from Interface of Two Media 39
Modes in Planar Waveguiding Structures 40
Dispersion Curves and the ‘‘Cut-Off’’ Condition 42
Input of Radiation into Waveguide by the Prism Coupler 44
Excitation of Guided Light Modes and Measurement of Their Parameters 46
Optical Losses in Waveguides 48
Dispersion Equations for the Imaginary Part of the Mode Propagation Constant 49
Measurement of Losses in Waveguides 51
Leaky and Plasmon Modes in Thin-Film Structures 54
Fabrication of Waveguiding Structures 56
New Applications of the m-Line Technique for Studying Thin-Film Structures 58
Recording the Spatial Distribution of the Light-Beam Intensity 58
Photodetectors in Waveguide Measurement Setups 60
Light Sources and Characterization of Light Beams 67
Techniques and Setup for the Measurement of Light Beam Intensity and its Spatial Distribution 78
Mathematical Processing the Recorded Spatial Distribution 81
Determination of the Light-Beam Parameters 85
Spatial Distribution of the Light Beam Intensity Reflected from the Prism Coupler and Measurements of Thin-Film Parameters 87
Spatial Fourier Spectroscopy of Guided Modes: Measuring Thin-Film Parameters 94
Fourier Transform Applications for Studying the Spatial Distribution of the Reflected Light Beam Intensity 94
Studying the Properties of Waveguiding Films 100
Features of Recording the Intensity Distribution and Measuring the Complex Propagation Constants of Modes 100
Determination of Thin-Film Parameters 105
Characterization of Thin Films by Prism Coupling of Leaky Modes 114
Basic Concepts and Instrumentation 115
Determinations of Waveguiding Film Parameters 120
Leaky Modes in Thin-Film Structures 123
Determination of Parameters of Metal Films and Surface Layers of Bulk Metal by the Plasmon Modes Excitation Technique 127
Measurements of Absorption Spectra of Thin Films 130
Absorption Optical Spectrophotometry: Possibilities and Limitations 131
Instrumentation of the Waveguide Spectroscopy of Thin Films 132
Special Features of Absorption Spectra Recording by Waveguide Spectroscopy and their Processing 136
Measurement of Absorption Spectra by the Fourier Spectroscopy of Guided Modes 137
Applications of the Waveguide Spectroscopy Techniques in Sensor Systems 144
Integrated-Optics Sensors and their Features 145
Gas Thin-Film Sensors 151
Physical Origin of Processes on Surfaces of Thin-Film Sensors 156
Evaluation of the Adlayer Parameters 163
Sensors with Recording of the Light Beam Reflection Coefficient 164
Gas Sensors 164
Integrated-Optics Sensors of the Angular Movement 166
Waveguide Microscopy of Thin Films 168
Optical Nonlinearity in Thin Films at Low-Intensity Light 172
Optical Nonlinearity and Thin-Film Nonlinear Constant Measurement Techniques 173
New Method of Determination of Nonlinear Constants of Films 181
Nonlinear Optical Properties of Azo-Dye Doped Polymeric Films 186
Optical Nonlinearity in Semiconductor Films 189
Nonlinear Optical Properties of As2S3 Films 190
Structure and Nonlinear Properties of ZnSe Films 195
Nonlinear Absorption in Semiconductor-Doped Glasses 202
Optical Nonlinearity in Multilayer Structures 208
Features of Optical Properties of Multilayer Structures 208
Interface Effects on the Nonlinear Optical Properties of Thin Films 214
New Potentialities for Studying Thin-Film Structures 219
References 224
Subject Index 236
Erscheint lt. Verlag | 19.12.2005 |
---|---|
Sprache | englisch |
Themenwelt | Sachbuch/Ratgeber |
Naturwissenschaften ► Chemie ► Analytische Chemie | |
Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik | |
Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
Naturwissenschaften ► Physik / Astronomie ► Optik | |
Technik ► Maschinenbau | |
ISBN-10 | 0-08-045789-4 / 0080457894 |
ISBN-13 | 978-0-08-045789-5 / 9780080457895 |
Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
Haben Sie eine Frage zum Produkt? |
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