X-Ray Microscopy and Spectromicroscopy -

X-Ray Microscopy and Spectromicroscopy

Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996
XX, 380 Seiten
1998
Springer Berlin (Hersteller)
978-3-540-63998-5 (ISBN)
101,24 inkl. MwSt
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This book gives a status report of the developing analytical technique of X-ray microscopy. The technique allows the highest resolution in electromagnetic-wave microscopy. In addition to the systematic treatment of this subject in the book a CD is included that presents the latest special results reported at the 1996 conference on X-ray microscopy. This book appeals to reseachers developing and/or using the new and important technique of X-ray microscopy. The subject is treated systematically in the book, which gives a status report on this analytical technique. The variety of applications is presented on the enclosed CD.

Summary:
X-Ray Microscopy Projects.- X-Ray Microscopy Applications.- Microspectroscopy and Spectromicroscopy.- X-Ray Optics.- X-Ray Sources.

Zusatzinfo 249 figs., 14 tabs., 1 CD-ROM
Sprache englisch
Gewicht 711 g
Einbandart gebunden
Schlagworte Röntgenstrahlenmikroskopie
ISBN-10 3-540-63998-5 / 3540639985
ISBN-13 978-3-540-63998-5 / 9783540639985
Zustand Neuware
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