Atomic Force Microscopy/Scanning Tunneling Microscopy
Kluwer Academic/Plenum Publishers (Verlag)
978-0-306-44890-4 (ISBN)
KEYNOTE ADDRESS: Materials Research Instrumentation Development: A New Paradigm.- Biological Nanostructure.- Scanning Force Microscopy on Living Virus-Infected Cells.- Scanning Probe Microscopy Imaging and Characterization of Biological Structures from Biomolecules to Living Cells.- Resolution and Limitations in Biological Applications of Atomic Force Microscopy.- Scanning Tunneling Microscopy Imaging of Biomolecules: I. Tubulin in Microtubules and Monolayers II. Bacterial Luciferase—A Model System for Anesthesia.- Scale-Area Analysis of Scanning Tunneling Microscopy/Atomic Force Microscopy Data by the Patchwork Method.- Imaging Matrix Materials and Fundamental Lamellae Structure of Biogenic Aragonite.- Atomic Force Microscopy Images of Starch Polymer Crystalline and Amorphous Structures.- Scanning Tunneling Microscopy Studies on Xanthan Gum.- Atomic Force Microscopic Imaging of Biomineral Powder Samples Formed by Deposits from Ethanolic Suspensions.- Nanostructure of Materials.- Scanning Tunneling Microscopy Studies of Fullerene C60.- Scanning Tunneling Microscopy Studies of Alcohol/Alkane Mixtures Adsorbed on Graphite Surfaces.- Fracture Surface Topography of TNT Using Atomic Force Microscopy.- Scanning Tunneling Microscopy and Spectroscopy of Carbon Nanotubes.- Scanning Tunneling Microscopy and Atomic Force Microscopy Investigations on Organic Material Thin Films and Adsorbate Particles in Air.- Image Contrast Mechanisms and Topology of Polyethylene Single Crystals: Low-Voltage, High-Resolution Scanning Electron Microscopy and Atomic Force Microscopy.- Examination of Plain Carbon Steels Using an Atomic Force Microscope.- Scanning Tunneling Microscopy of Porous Silicon-Based Surfaces.- Atomic Force Microscope Study of Ferroelastic Domains.- Atomic Scale Imaging ofMinerals with the Atomic Force Microscope.- Scanning Tunneling Microscopy of the Structural and Electronic Properties of Chemical-Vapor Deposited Diamond Films.- Combined Scanning Tunneling Microscope and Quartz Microbalance Study of Molecularly Thin Water Layers.- Atomic Force Microscopy of Polymer Droplets.- Scanning Tunneling Microscopy and Atomic Force Microscopy Studies of Conducting Polymer Films.- Morphological Features of Polyethylene and Polyimides by Atomic Force Microscopy.- Studies of High Performance Fibers by Atomic Force Microscopy and Molecular Simulation.- Atomic Force and Electron Microscopic Investigations of Lead Selenide Crystals Grown under Monolayers.- Atomic Force Microscopy Studies of Ultra-Thin Films of Cadmium Phosphide Nanoclusters on Mica.- Comparative Study of the Surface Roughness of Oxide Thin Films.- Methodologies and Techniques.- Applications of a Combined Scanning Tunneling Microscope and Quartz Microbalance.- Surface Science at the Nanoscale: Molecular Imaging and Surface Forces.- Linearity and Calibration of Scanning Probe Microscope Images.- Sample Holders for Imaging Intact Particles with the Scanning Force Microscope.- Scanning Tunneling Microscopy of Freeze Fracture Replicas of Biomaterials.- The Scanning Probe Microscope as a Metrology Tool.- Use of Atomic Force Microscopy in the Determination of Image Contrast in Microtomed Samples of Thermotropic Liquid Crystals.- Photon Tunneling Microscopy of Polymers.- Morphology and Molecular Ordering of Langmuir-Blodgett and Self-Organized Films from Organic Compounds.- PT/IR Nanotips—A Mechanical Technique for Sharpening Tips Utilized by a Scanning Tunneling Microscope.- Atomic Force Microscopy Study of Electron Beam Patterned SiO2.- Measuring the Mechanical Properties of Preformed,Nanometer-Size Gold Clusters with the Atomic Force Microscope.- Analysis and Interpretation of Scanning Tunneling Microscopy Images in an Electrochemical Environment: Copper on AU(111).- A Closed-Loop Optical Scan Correction System for Scanning Probe Microscopes.- Vibrating Probe (AC) Methods in Atomic Force Microscopy.
Erscheint lt. Verlag | 31.3.1995 |
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Zusatzinfo | X, 454 p. |
Verlagsort | New York |
Sprache | englisch |
Maße | 156 x 234 mm |
Themenwelt | Naturwissenschaften |
Technik ► Maschinenbau | |
ISBN-10 | 0-306-44890-4 / 0306448904 |
ISBN-13 | 978-0-306-44890-4 / 9780306448904 |
Zustand | Neuware |
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