EMC 2008
Springer Berlin (Verlag)
978-3-540-85225-4 (ISBN)
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Materials for Information Technology.- Nanomaterials and Catalysts.- Structural and Functional Materials.- Soft Matter and Polymers.- Materials in Mineralogy, Geology and Archaeology. Materials Science.- Materials for Information Technology.- Nanomaterials and Catalysts.- Structural and Functional Materials.- Soft Matter and Polymers.- Materials in Mineralogy, Geology and Archaeology.
| Erscheint lt. Verlag | 26.8.2008 |
|---|---|
| Zusatzinfo | XXXVIII, 870 p. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Gewicht | 1442 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Allgemeines / Lexika |
| Schlagworte | electron • electron microscopy • Microscopy • Nanomaterial • Polymer |
| ISBN-10 | 3-540-85225-5 / 3540852255 |
| ISBN-13 | 978-3-540-85225-4 / 9783540852254 |
| Zustand | Neuware |
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