Advanced Tomographic Methods in Materials Research and Engineering -

Advanced Tomographic Methods in Materials Research and Engineering

John Banhart (Herausgeber)

Buch | Hardcover
490 Seiten
2008
Oxford University Press (Verlag)
978-0-19-921324-5 (ISBN)
209,95 inkl. MwSt
Tomography provides three-dimensional images of materials or engineering components and an unprecedented insight into their internal structure. This book, written for applied physicists, materials scientists and engineers, discusses recent developments in the field, such as the extension of tomographic methods to materials research and engineering.
Tomography provides three-dimensional images of heterogeneous materials or engineering components, and offers an unprecedented insight into their internal structure. By using X-rays generated by synchrotrons, neutrons from nuclear reactors, or electrons provided by transmission electron microscopes, hitherto invisible structures can be revealed which are not accessible to conventional tomography based on X-ray tubes.

This book is mainly written for applied physicists, materials scientists and engineers. It provides detailed descriptions of the recent developments in this field, especially the extension of tomography to materials research and engineering. The book is grouped into four parts: a general introduction into the principles of tomography, image analysis and the interactions between radiation and matter, and one part each for synchrotron X-ray tomography, neutron tomography, and electron tomography. Within these parts, individual chapters written by different authors describe important versions of tomography, and also provide examples of applications to demonstrate the capacity of the methods. The accompanying CD-ROM contains some typical data sets and programs to reconstruct, analyse and visualise the three-dimensional data.

John Banhart - Editor Professor for Materials Science at Technical University Berlin and Head of the Department of Materials Research at Hahn-Meitner Institute Berlin 1984: Degree in Physics, University of Munich 1989: PhD in Physical Chemistry, University of Munich 1990: Postdoc at University of Vienna 1998: Habilitation (2nd PhD) in Solid State Physics, University of Bremen 1991-2001: Senior Scientist at Fraunhofer-Institute for Materials Research Bremen 2002: Current Position

1. Introduction ; 2. Some Mathematical Concepts for Tomographic Reconstruction ; 3. Visualisation, Processing and Analysis of Tomographic Data ; 4. Radiation Sources and Interaction of Radiation with Matter ; 5. Synchrotron X-ray Absorption Tomography ; 6. Phase Contrast and Holographic Tomography ; 7. Tomography using magnifying optics ; 8. Scanning Tomography ; 9. Three-dimensional X-ray Diffraction ; 10. Detectors for Synchrotron Tomography ; 11. Fundamentals of Electron Tomography ; 12. Applications of Electron Tomography ; 13. Neutron Absorption Tomography ; 14. Neutron Phase Contrast and Polarised Neutron Tomography ; 15. Neutron Refraction and Small-Angle Scattering Tomography ; Appendix A: Facilities for Tomography ; Appendix B: Examples on CDROM

Erscheint lt. Verlag 20.3.2008
Reihe/Serie Monographs on the Physics and Chemistry of Materials ; 66
Zusatzinfo 233 halftones and line drawings, 4 page colour plate section
Verlagsort Oxford
Sprache englisch
Maße 162 x 240 mm
Gewicht 955 g
Themenwelt Medizinische Fachgebiete Radiologie / Bildgebende Verfahren Computertomographie
Naturwissenschaften Geowissenschaften Geophysik
Technik Maschinenbau
ISBN-10 0-19-921324-0 / 0199213240
ISBN-13 978-0-19-921324-5 / 9780199213245
Zustand Neuware
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