Modern Developments in X-Ray and Neutron Optics
Springer Berlin (Verlag)
978-3-540-74560-0 (ISBN)
This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation as well as recent theoretical approaches to modelling and ray-tracing the X-ray and neutron optical systems. It is based on the joint research activities of specialists in X-ray and neutron optics from 11 countries, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002--2006. The chapters are written by leading specialists from European laboratories, universities and large facilities. In addition to new ideas and concepts, the contents provide a large amount of practical information about recently implemented devices and methods.
Alexei Erko received PhD degree in experimental physics (1981) from the Moscow Physical-Engineering Institute, Habilitation in Physics in 1991 and Professor in experimental physics in 1992. From 1978 to 1994 worked as Senior Scientist and later as a Head of Laboratory at the Institute of Solid State Physics and Institute of Microelectronics Technology Russian Academy of Sciences (Chernogolovka). Since 1994 he has a position of Senior Scientist at BESSY GmbH, Berlin, Germany. Research interests include x-ray optics, x-ray holography and synchrotron radiation beamlines design.
Theoretical Approaches and Calculations.- X-Ray and Neutron Optical Systems.- The BESSY Raytrace Program RAY.- Neutron Beam Phase Space Mapping.- Raytrace of Neutron Optical Systems with RESTRAX.- Wavefront Propagation.- Theoretical Analysis of X-Ray Waveguides.- Focusing Optics for Neutrons.- Volume Effects in Zone Plates.- Nano-Optics Metrology.- Slope Error and Surface Roughness.- The Long Trace Profilers.- The Nanometer Optical Component Measuring Machine.- Shape Optimization of High Performance X-Ray Optics.- Measurement of Groove Density of Diffraction Gratings.- The COST P7 Round Robin for Slope Measuring Profilers.- Hartmann and Shack-Hartmann Wavefront Sensors for Sub-nanometric Metrology.- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data.- Refection/Refraction Optics.- Hard X-Ray Microoptics.- Capillary Optics for X-Rays.- Reflective Optical Arrays.- Reflective Optical Structures and Imaging Detector Systems.- CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays.- Multilayer Optics Developments.- Neutron Supermirror Development.- Stress Reduction in Multilayers Used for X-Ray and Neutron Optics.- Multilayers with Ultra-Short Periods.- Specially Designed Multilayers.- Diffraction Optics.- Diffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces.- Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering.- Volume Modulated Diffraction X-Ray Optics.- High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors.- Thermal Effects under Synchrotron Radiation Power Absorption.
| Erscheint lt. Verlag | 14.4.2008 |
|---|---|
| Reihe/Serie | Springer Series in Optical Sciences |
| Zusatzinfo | XXIV, 534 p. 299 illus., 5 illus. in color. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 962 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Optik |
| Technik ► Elektrotechnik / Energietechnik | |
| Schlagworte | Absorption • Design • Development • diffraction • Imaging • machine • Measurement • Metrology • monochromator • Neutron Optics • Optics • Optimization • polarization • Prism • refraction • Sensor • shape optimization • X-Ray • X-ray optics |
| ISBN-10 | 3-540-74560-2 / 3540745602 |
| ISBN-13 | 978-3-540-74560-0 / 9783540745600 |
| Zustand | Neuware |
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