Handbook of Surface and Interface Analysis -

Handbook of Surface and Interface Analysis

Methods for Problem-Solving, Second Edition

John C. Riviere, Sverre Myhra (Herausgeber)

Buch | Hardcover
680 Seiten
2009 | 2nd edition
Crc Press Inc (Verlag)
978-0-8493-7558-3 (ISBN)
239,95 inkl. MwSt
Describes the physical basis and technical implementation of the commonly used techniques for materials characterization. This book features chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials.
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors’ firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions.

Major instrumental assets are generally funded and maintained as central facilities to help potential users make informed decisions about their appropriate use in solving analytical problem(s). Building on the popular first edition, this long-awaited second edition was motivated by the increasingly common industry view that it is more cost-effective to contract out analytical services than to maintain in-house facilities. Guided by that trend, this book focuses on developing strategic thinking for those who decide which facilities to access and where to subcontract analytical work. It covers most of the major tactical issues that are relevant at the location in which data are being produced.

New Information in this Second Edition Includes:






Electron-optical imaging techniques and associated analytical methods



Techniques based on synchrotron sources



Convenient and versatile scanning probe group methods



Scanning tunneling microscopy, biocompatible materials, and nano-structured materials

Assessing benefits and limitations of different methodologies, this volume provides the essential physical basis and common modes of operation for groups of techniques. Exploring methods for characterization and analysis of particular types of materials and/or their relevant applications—the text synergizes traditional and novel ideas to help readers develop a versatile and rational approach to surface and interface analysis.

Oxford University, Yarnton. UK Oxford University, Yarnton, UK Santa Barbara Science Project, Santa Barbara, USA

Introduction. Elements of Problem-Solving/Materials Characterization. How to Use This Book. Spectroscopic Techniques. Compositional Analysis by AES and XPS. Ion Beam Techniques. In-Depth Analysis. Surface and Interface Analysis by HRTEM and XTEM. Synchrotron-based Techniques. Scanning Force Microscopy. Scanning Tunneling Microscopy. Metallurgy. Minerals, Ceramics, and Glasses. Composites. Corrosion. Tribology. Catalysts. Adhesion. Biocompatible Materials. Nano-structured Materials.

Erscheint lt. Verlag 3.7.2009
Zusatzinfo 42 Tables, black and white; 402 Illustrations, black and white
Verlagsort Bosa Roca
Sprache englisch
Maße 178 x 254 mm
Gewicht 1428 g
Themenwelt Naturwissenschaften Physik / Astronomie Thermodynamik
ISBN-10 0-8493-7558-4 / 0849375584
ISBN-13 978-0-8493-7558-3 / 9780849375583
Zustand Neuware
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