Thin Films & Coatings
New Research
2005
Nova Science Publishers Inc (Verlag)
978-1-59454-517-7 (ISBN)
Nova Science Publishers Inc (Verlag)
978-1-59454-517-7 (ISBN)
Examines the concepts of crystal structure and defects in crystalline thin films such as grain boundaries, dislocations and vacancies. The general nature of film growth from atoms equilibrating with the service, through the initial stages of growth to film coalescence and zone models is also within the scope of this book.
The broad field of thin film technology is based first of all on the film growth processes in general. The concepts of crystal structure and defects in crystalline thin films such as grain boundaries, dislocations and vacancies are examined. The general nature of film growth from atoms equilibrating with the service, through the initial stages of growth to film coalescence and zone models is also within the scope of this book as are evaporation, sputter deposition and chemical vapour deposition. Thin films are widely used in microelectronics, chemistry and a wide array of related fields. This book offers new research in this exploding field.
The broad field of thin film technology is based first of all on the film growth processes in general. The concepts of crystal structure and defects in crystalline thin films such as grain boundaries, dislocations and vacancies are examined. The general nature of film growth from atoms equilibrating with the service, through the initial stages of growth to film coalescence and zone models is also within the scope of this book as are evaporation, sputter deposition and chemical vapour deposition. Thin films are widely used in microelectronics, chemistry and a wide array of related fields. This book offers new research in this exploding field.
Preface; Photoluminescent Materials Based on Laser-Modified Fullerenes-Doped Polymer Thin Films; Leakage Current and Conduction Mechanisms in Ta2O5 for Gigabit Dynamic Memories Applications; Hopping Transport of Dark and Photoexcited Carriers in Si Rich SiO2 Thin Films; Trap-Assisted Tunneling in Si/SiO2 Structures; Tailoring the Physical Properties of Polycrystalline Cd 0.96 Zn0.04 Te Thin Films by Boron Ion Implantation; Recent Progress in Study of Bismuth Layer Structured Ferroelectrics; Plasma Assisted Thermochemical Treatments; In Vitro Evaluation of Mechanical Integrity of Bioceramic Coatings on Metallic Implants; Mechanical Behaviour of PVD CrN Coated Steel Evaluated by Means of FEM Modelling; Index.
Erscheint lt. Verlag | 4.7.2005 |
---|---|
Zusatzinfo | Illustrations (some col.) |
Verlagsort | New York |
Sprache | englisch |
Gewicht | 674 g |
Themenwelt | Naturwissenschaften ► Chemie ► Technische Chemie |
Technik ► Elektrotechnik / Energietechnik | |
ISBN-10 | 1-59454-517-0 / 1594545170 |
ISBN-13 | 978-1-59454-517-7 / 9781594545177 |
Zustand | Neuware |
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