Microstructural Characterisation Techniques
Springer Verlag, Singapore
978-981-19-3511-4 (ISBN)
Prof. Gunturi Venkata Sitarama Sastry is former Professor, Department of Metallurgical Engineering and also Dean of Academic Affairs, IIT(BHU), Varanasi, India for a three year period. He began extensive use of transmission electron microscopy since his doctoral work on rapidly quenched aluminum alloys at IT-BHU, Varanasi. His research tools have been diverse microstructural characterization techniques with major emphasis on TEM. Most of his publications in high impact international Journals reflect this vast expertise in the field. Several of his students benefited from his courses on metallographic techniques taught at the Department of Metallurgical Engineering, IIT(BHU), Varanasi, India (formerly Institute of Technology, BHU). He also conducted many short-term courses on electron microscopy and associated techniques at various institutions and research laboratories. He headed the National Electron Microscopy Facility established at the Department for over five years and later worked for the augmentation of new facilities over there. The Electron Microscope Society of India recognized his contributions to the field by bestowing upon him the ‘Lifetime Achievement Award 2017’.
Introduction.- Electromagnetic Waves and Electron Waves.- Fourier Analysis and Fourier Transformation.- Transmission Electron Microscope.- Electron Diffraction.- Optical Microscopy.- Transmission Electron Microscopy.- Lens-less Electron Microscopy
Erscheinungsdatum | 21.09.2023 |
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Reihe/Serie | Indian Institute of Metals Series |
Zusatzinfo | 60 Illustrations, color; 149 Illustrations, black and white; XIX, 242 p. 209 illus., 60 illus. in color. |
Verlagsort | Singapore |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Technik ► Maschinenbau | |
Schlagworte | HREM y • Indexing of Electron Diffraction Patterns • metallography • Optical microscopy • Scanning Electron Microscopy • Transmission Electron Microscopy |
ISBN-10 | 981-19-3511-4 / 9811935114 |
ISBN-13 | 978-981-19-3511-4 / 9789811935114 |
Zustand | Neuware |
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