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Failure Analysis

High Technology Devices

Daniel J. D. Sullivan, Eric J. Carleton (Autoren)

Buch | Softcover

128 Seiten

2022
De Gruyter (Verlag)
978-1-5015-2478-3 (ISBN)

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The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

Dr. Daniel J. D. Sullivan attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, “Don’t Date Crazy” by DJDS, and published a board game called Infection. Dr. Eric J. Carleton is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.

Erscheinungsdatum	10.10.2022
Reihe/Serie	De Gruyter STEM
Zusatzinfo	51 Illustrations, color; 31 Illustrations, black and white
Verlagsort	New York
Sprache	englisch
Maße	170 x 240 mm
Gewicht	238 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Technik ► Elektrotechnik / Energietechnik
	Technik ► Maschinenbau
ISBN-10	1-5015-2478-X / 150152478X
ISBN-13	978-1-5015-2478-3 / 9781501524783
Zustand	Neuware