Nanosources and Manipulation of Atoms Under High Fields and Temperatures
Kluwer Academic Publishers (Verlag)
978-0-7923-2266-5 (ISBN)
This volume contains the proceedings of the NATO Advanced Research Workshop which reviewed the basic principles and highlighted the progress made during the last few years on the atomic scale sources and the interactions between microprobes and samples. The motivation is to use the novel properties attached to the atomic dimensions to develop nanoscale technologies.
Part 1 Introduction: Local Probe Methods and Miniaturization. Part 2 Nano-sources and Applications: Low Energy Electron Microscopy. Nanotips and Transmission Low Energy Electron Diffraction. Lensless Low Energy Electron Point Source Microscopy. Electron Focusing - Computer Simulation. Nanotip Fashioning and Nanosource Characteristics. Electron Emission from Nanometer-Size Metallic Clusters - Electronic States and Structural Stability of Supported Au Clusters. On the Energy Dissipation in Field Emission and Tunneling Microscopy. Miniaturized Electron Microscope. Direct Observation of the Motion of Individual Surface Atoms on a Picosecond Timescale. Single-Electron Manipulation under High-Field at Room Temperature. Focused Ion Beams and their Applications in Microfabrication. Miniaturized Liquid Metal Ion Sources (MIL-MIS). Integrated Microtips - Application to Flat Displays. Part 3 Tip-Surface Interactions and Applications - Field-Induced Transfer of an Electropositive Atom between Two Closely Spaced Electrodes. Molecular Dynamics Simulations of Metal Surfaces - Surface Melting and Non-Melting, and Tip-Surface Interactions. Atomic Manipulation using Field Evaporation. What is Underneath? Moving Atoms and Molecules to Find Out. Local Experiments using Nanofabricated Structures in STM. Quantum Atom Switch - Tunneling of Xe Atoms. The Eigler Xe Switch - its Atomic Structure from Xe Energy Minimization and STM Image Calculations. Friction and Forces on an Atomic Scale. Atomic-Scale Adhesion. Local Modification of Langmuir-Blodgett Films by AFM. Layered Semiconductors as Materials for (sub)Nanometer Scale Surface Modification with the STM. Micromachined Silicon Tools for Nanometer-Scale Science.
Reihe/Serie | NATO Science Series C ; 235 |
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Zusatzinfo | 1 |
Sprache | englisch |
Maße | 156 x 234 mm |
Gewicht | 648 g |
Einbandart | gebunden |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Allgemeines / Lexika |
Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik | |
ISBN-10 | 0-7923-2266-5 / 0792322665 |
ISBN-13 | 978-0-7923-2266-5 / 9780792322665 |
Zustand | Neuware |
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