Microscopy of Semiconducting Materials 1995, Proceedings of the Institute of Physics Conference held at Oxford University, 20-23 March 1995

This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. It contains both invited review papers, as well as in-depth coverage of recent research results.

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This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. Contains invited review papers together with in-depth coverage of the latest research results. Encompassing techniques from transmission and scanning electron microscopy, X-ray topography and diffraction, scanning probe microscopy and atom probe microanalysis, as applied to the whole range of semiconducting materials.