X-ray Phase-Contrast Imaging Using Near-Field Speckles
Springer International Publishing (Verlag)
978-3-030-66328-5 (ISBN)
Marie-Christine Zdora has been working on X-ray phase-contrast imaging since 2013. She received her Bachelor of Science and Master of Science in Physics from Technical University Munich in 2011 and 2014, respectively. She, furthermore, holds a Master of Medical Physics from the University of Sydney (2013). In 2015, Marie-Christine moved to Diamond Light Source, where she pursued a PhD in a joint studentship with University College London. In January 2020, she was awarded her PhD in Physics on the topic of X-ray speckle-based phase-contrast imaging from University College London. She is now a postdoctoral research fellow at the University of Southampton.
Introduction.- Principles of X-Ray Imaging.- Synchrotron Beamlines, Instrumentation and Contributions.- X-ray Single-Grating Interferometry.- Principles and State of the Art Of X-Ray Speckle-Based Imaging.- The Unified Modulated Pattern Analysis.- At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis.- 3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis.- Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging.- Summary, Conclusions and Outlook.- Appendices.
Erscheinungsdatum | 01.03.2021 |
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Reihe/Serie | Springer Theses |
Zusatzinfo | XXI, 337 p. 102 illus., 88 illus. in color. |
Verlagsort | Cham |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 705 g |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Allgemeines / Lexika |
Technik ► Maschinenbau | |
Schlagworte | Computed tomography • X-Ray Dark-Field Imaging • X-Ray Grating Interferometry • X-Ray Multimodal Imaging • X-Ray Near-Field Speckles • X-ray Phase-contrast imaging • X-Ray Phase Tomography • X-Ray Speckle-Based Imaging |
ISBN-10 | 3-030-66328-0 / 3030663280 |
ISBN-13 | 978-3-030-66328-5 / 9783030663285 |
Zustand | Neuware |
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