Electron Microscopy of Nanotubes
Springer-Verlag New York Inc.
978-1-4020-7361-8 (ISBN)
I. Diffraction, Imaging, and Spectroscopy of Carbon-Based Nanotubes.- 1. Diffraction and Imaging of Single-Walled Carbon Nanotubes.- 2. Electron Diffraction and Microscopy of Single-Walled Carbon Nanotube Bundles.- 3. Nanodiffraction of Carbon Nanotubes.- 4. The Smallest Carbon Nanotubes.- 5. Electron Energy-Loss Spectroscopy of Carbon Nanotubes and Onions.- 6. Carbon Nanostructures Under the Electron Beam: Formation of New Structures and In-Situ Study of Radiation-Induced Processes.- II. Nanomeasurements of Carbon Nanotubes based on In-Situ TEM.- 7. In-Situ Mechanical Properties of Nanotubes and Nanowires.- 8. In-Situ Field Emission of Carbon Nanotubes.- 9. In-Situ Electric Transport of Carbon Nanotubes.- III. Tabular Structures and Nanocrystals Grown by Filling Nanotubes.- 10. Electron Microscopy of Boron Nitride Nanotubes.- 11. Inorganic Nanoparticles with Fullerene-like Structure and Inorganic Nanotubes.- 12. Integral Atomic Layer Architectures of ID Crystals Inserted into Single-Walled Carbon Nanotubes.
Zusatzinfo | XIV, 310 p. |
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Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
Technik ► Elektrotechnik / Energietechnik | |
Technik ► Maschinenbau | |
ISBN-10 | 1-4020-7361-5 / 1402073615 |
ISBN-13 | 978-1-4020-7361-8 / 9781402073618 |
Zustand | Neuware |
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