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Handbook of Charged Particle Optics

Jon Orloff (Herausgeber)

Buch | Hardcover
528 Seiten
1997
Crc Press Inc (Verlag)
978-0-8493-2513-7 (ISBN)
169,95 inkl. MwSt
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A guide to understanding, designing, and using high-resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This book includes chapters on liquid metal ion sources, and Schottky cathodes.
This timely handbook contains chapters on the essential elements of high resolution charged particle optics and is written by many of the world's leading research scientists. It is a complete guide to understanding, designing, and using high resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This handbook is evenly balanced between theory and application, and covers all the most important topics in this growing area. Handbook of High Resolution Charged Particle Optics explains how and why high resolution instruments work and how to apply this information when designing or using them.

Computational Techniques for the Design of Charged Particle Optical Designs, E. Munro (Munro's Electron Optics Software, Ltd., U.K.)
A Review of the Zr/O Schottky Cathode, L.W. Swanson and G. Schwind (FEI Company, U.S.)
Liquid Metal Ion Sources, G.L.R. Mair (Department of Physics, University of Athens, Greece)
Magnetic Lenses for Electron Microscopy, K. Tsuno (JEOL, Ltd., Japan)
Electrostatic Lenses, B. Lencova (Institute for Scientific Instruments of the Czech Academy of Sciences, Czech Republic)
Aberrations, P.W. Hawkes (Laboratoire du Optique Electronique, C.N.R.S., France)
Space Charge, P. Kruitt and G. Jansen (Technical University of Delft, The Netherlands)
Resolution, M. Sato (Hitachi, Ltd., Japan)
The Transmission Electron Microscope, F. Nagata (Hitachi, Ltd., Japan)
The Scanning Electron Microscope, M. Postek (National Institute of Science and Technology, U.S.)
The Scanning Transmission Electron Microscope, A.V. Crewe (Department of Physics, University of Chicago, U.S.)
Focused Ion Beams, M. Utlaut (University of Portland, U.S.)
Index

Erscheint lt. Verlag 25.6.1997
Zusatzinfo 615 equations; 3 Halftones, black and white; 40 Tables, black and white
Verlagsort Bosa Roca
Sprache englisch
Maße 178 x 254 mm
Gewicht 998 g
Einbandart gebunden
Themenwelt Naturwissenschaften Physik / Astronomie Hochenergiephysik / Teilchenphysik
Naturwissenschaften Physik / Astronomie Optik
ISBN-10 0-8493-2513-7 / 0849325137
ISBN-13 978-0-8493-2513-7 / 9780849325137
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