Phase-Contrast and Dark-Field Imaging

Buch | Softcover

146 Seiten

2019
MDPI (Verlag)
978-3-03897-284-6 (ISBN)

Keine Verlagsinformationen verfügbar

Artikel merken

The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.

Fraunhofer Development Center X-ray Technology EZRT

Erscheinungsdatum	05.03.2022
Mitarbeit	Gast Herausgeber: Simon Zabler
Verlagsort	Basel
Sprache	englisch
Maße	170 x 244 mm
Themenwelt	Informatik ► Grafik / Design ► Digitale Bildverarbeitung
	Mathematik / Informatik ► Mathematik
	Naturwissenschaften ► Physik / Astronomie
Schlagworte	Coded-aperture imaging • Computed tomography • cultural heritage • Dark-Field Imaging • Electron Backscatter imaging • Fourier image analysis • Image Processing • Medical Imaging • Moiré pattern analysis • Talbot-Interferometer • X-ray Phase-contrast imaging • X-ray scattering
ISBN-10	3-03897-284-3 / 3038972843
ISBN-13	978-3-03897-284-6 / 9783038972846
Zustand	Neuware