Leading Edge Techniques in Forensic Trace Evidence Analysis -

Leading Edge Techniques in Forensic Trace Evidence Analysis

More New Trace Analysis Methods

Robert D. Blackledge (Herausgeber)

Buch | Hardcover
368 Seiten
2023
John Wiley & Sons Inc (Verlag)
978-1-119-59161-0 (ISBN)
114,38 inkl. MwSt
Leading Edge Techniques in Forensic Trace Evidence Analysis In-depth exploration of the latest methodologies, tools, and techniques for analyzing trace evidence

In Leading Edge Techniques in Forensic Trace Evidence Analysis, distinguished and highly qualified contributors cover the significant advances in methodology and instruments that are now being used to analyze trace evidence in forensic laboratories, including new techniques used to determine authenticity of objects and artifacts (such as Combined Raman/LIBS Microscopy) and those used to analyze surface treatments (such as py-GC-PARCI-MS). The work also covers new evidence types, such as surface-modified fibers, microscopic particles, and shimmer, and provides detailed explanations and practical examples of all of the aforementioned topics.

Among the topics covered are:



Forensic analysis of shimmer particles in cosmetics samples, glitter and other flake pigments, and x-ray photoelectron spectroscopy
Surface acoustic wave nebulization mass spectrometry, forensic applications of gas chromatography vacuum ultraviolet, and spectroscopy paired with mass spectrometry
Density determination and separation via magneto-Archimedes levitation and elemental imaging of forensic traces with macro and micro XRF
Characterization of human head hairs via proteomics and Raman and surface-enriched Raman scattering (SERS) for trace analysis

With detailed explanations of modern methodologies, tools, techniques, and evidence types in trace evidence forensics, along with helpful guidance to put covered concepts into practice, Leading Edge Techniques in Forensic Trace Evidence Analysis serves as an invaluable hands-on reference for scientists in forensic laboratories worldwide.

Robert D. Blackledge is a forensic chemist consultant and the former Senior Forensic Chemist at the Naval Criminal Investigative Service, Regional Forensic Laboratory in San Diego, California. He is the author or co-author of roughly 55 journal articles and book chapters, and he edited the book Forensic Analysis on the Cutting Edge: New Methods for Trace Evidence Analysis (Wiley, 2007). Reports of his research have been published in the FBI’s Law Enforcement Bulletin, the FBI’s Crime Laboratory Digest, the Journal of Forensic Sciences, Forensic Science International, and other publications.

List of Contributors

Foreword

Preface

Chapter 1 Forensic Analysis of Shimmer Particles in Cosmetic Samples
Kandyss Najjar, Robert D. Blackledge and Candice Bridge

Chapter 2 Glitter and other Flake Pigments
Charles A. Bishop and Robert D. Blackledge

Chapter 3 X-Ray Photoelectron Spectroscopy
Christopher Deeks and Robert D. Blackledge

Chapter 4 Density Determination and Separation via Magneto-Archimedes Levitation
Christoffer K. Abrahamsson, Shencheng Ge, Jefferey G. Bell, Robert D. Blackledge, George M. Whitesides

Chapter 5 Forensic Applications of Gas Chromaography Vacuum Ultraviolet Spectroscopy Paired with Mass Spectrometry
Ryan Schonert

Chapter 6 Surface Acoustic Wave Nebulization-Mass Spectrometry
Alina Astefanei and Roselina Medico

Chapter 7 Elemental imaging of forensic traces with macro and micro XRF
Alwin Knijnenberg, Annelies van Loon, Joris Dik, Arian van Asten

Chapter 8 Characterization of Human Head Hairs via Single Amino Acid Typing
Joseph Donfack, Maria Lawas, Jocelyn V. Abonamah, Brian A. Eckenrode

Chapter 9 Photo-induced Force Microscopy
Sung I. Park, Padraic O’Reilly and Graceson Aufderheide

Chapter 10 Combined Raman/LIBS Microscopy
Cyril Muehlethaler

Index

Erscheinungsdatum
Verlagsort New York
Sprache englisch
Gewicht 657 g
Themenwelt Naturwissenschaften Biologie
Naturwissenschaften Chemie Analytische Chemie
ISBN-10 1-119-59161-9 / 1119591619
ISBN-13 978-1-119-59161-0 / 9781119591610
Zustand Neuware
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von Friedrich W. Küster; Alfred Thiel; Andreas Seubert

Buch | Softcover (2023)
De Gruyter (Verlag)
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