Quantum Metrology, Imaging, and Communication - David S. Simon, Gregg Jaeger, Alexander V. Sergienko

Quantum Metrology, Imaging, and Communication

Buch | Softcover
XII, 273 Seiten
2018 | 1. Softcover reprint of the original 1st ed. 2017
Springer International Publishing (Verlag)
978-3-319-83540-2 (ISBN)
160,49 inkl. MwSt
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

David Simon. Professor, Stonehill College, Easton MA 02357, USA Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA Alexander V. Sergienko, Boston University, Boston MA 02215, USA

Quantum Optics and Entanglement.- Two-Photon Interference- Aberration and Dispersion Cancelation.- Quantum Metrology.- Polarization Mode Dispersion.- Ghost Imaging and Related Topics.- Quantum Microscopy.- Correlated and Entangled Orbital Angular Momentum.- Quantum Communication and Cryptography.- Appendices A: Review of Optics.- B: Optical Fields in Quantum Mechanics.- C: Optical Effects of Aberration and Turbulence.- D: Phase Matching in Spontaneous Parametric Down Conversion.- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.

Erscheinungsdatum
Reihe/Serie Quantum Science and Technology
Zusatzinfo XII, 273 p. 105 illus., 68 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 444 g
Themenwelt Naturwissenschaften Physik / Astronomie Optik
Naturwissenschaften Physik / Astronomie Quantenphysik
Naturwissenschaften Physik / Astronomie Theoretische Physik
Schlagworte Applied Quantum Optics • Dispersion Cancellation • Experimental Optics • Ghost Imaging • Introdution to Quantum Optics • Quantum Imaging • Quantum Lithography • Quantum Microscopy • Quantum Optical Cryptography • Quantum Optical Metrology
ISBN-10 3-319-83540-8 / 3319835408
ISBN-13 978-3-319-83540-2 / 9783319835402
Zustand Neuware
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