Advanced Transmission Electron Microscopy
Springer-Verlag New York Inc.
978-1-4939-8249-3 (ISBN)
Jian-Min Zuo received his Ph.D. in Physics from Arizona State University in 1989. He is Racheff Professor of Materials Science and Engineering at University of Illinois, Urbana-Champaign. Prior to joining the faculty at the University of Illinois, he was a research scientist in Physics at Arizona State University and a visiting scientist to a number of universities and institutes in Germany, Japan and Norway. His current research topics include nanostructured materials and their structure determination, ferroelectric crystals, diffraction tomography, in-situ and fast electron microscopy. He is the recipient of the 2001 Burton Award of the Microscopy Society of America, Ruska prize of 2015 from German Microscopy Society and fellow of American Physical Society. John C. H. Spence received his PhD in Physics from Melbourne University in Australia, followed by a postdoc in Materials Science at Oxford, UK. He is Snell Professor of Physics at Arizona State University, where he teaches condensed matter physics. He is a Foreign Member of the Royal Society and Australian Academy, and a Fellow of the American Association for the Advancement of Science. His research interests are in new forms of microscopy, diffraction physics, materials science, condensed matter physics and structural biology. He is currently Director of Science for the NSF Science and Technology Center on the development of X-ray lasers for biology (BIoXFEL).
Introduction and historical background.- Electron Waves and Wave Propagation.- The geometry of electron diffraction patterns.- Kinematical Theory of Electron Diffraction.- Dynamical Theory of Electron Diffraction for Perfect Crystals.- Electron optics.- Lens aberrations and Aberration Correction.- Electron Sources.- Electron Detectors.- Instrumentation and experimental techniques.- Crystal symmetry.- Crystal structure and bonding.- Diffuse Scattering.- Atomic resolution electron imaging.- Imaging and characterization of crystal defects.- Strain Measurements and Mapping.- Structure of Nanocrystals, Nanoparticles and Nanotubes.
Erscheinungsdatum | 28.08.2018 |
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Zusatzinfo | 218 Illustrations, color; 92 Illustrations, black and white; XXVI, 729 p. 310 illus., 218 illus. in color. |
Verlagsort | New York |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Optik |
Technik ► Maschinenbau | |
ISBN-10 | 1-4939-8249-4 / 1493982494 |
ISBN-13 | 978-1-4939-8249-3 / 9781493982493 |
Zustand | Neuware |
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