Electron Back Scatter Diffraction

Electron back scatter diffraction (EBSD) is an immensely powerful method of characterizing microstructure. The technique is used in many scanning electron microscopes to examine the structure, pattern, and orientation of samples and is an important tool in materials science, physics, and earth science labs. This up-to-date, comprehensive introduction covers the theory of EBSD, pattern formation, recording EBSD patterns, calibration, and orientation measurement.