Spectroscopic Ellipsometry for Photovoltaics

Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University. Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.

Introduction.- Part I: Fundamental Principles of Ellipsometry.- Measurement Technique of Ellipsometry.- Data Analysis.- Optical Properties of Semiconductors.- Dielectric Function Modeling.- Effect of Roughness on Ellipsometry Analysis.- Part II: Characterization of Materials and Structures.- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon.- Crystalline Silicon Solar Cells.- Amorphous/Crystalline Si Heterojunction Solar Cells.- Optical Properties of Cu(In,Ga)Se₂.- Real Time and In-Situ Spectroscopic Ellipsometry of Cu_yIn_1-xGa_xSe₂ for Complex Dielectric Function Determination and Parameterization.- Cu₂ZnSn(S,Se)₄ and Related Materials.- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics.- High Efficiency III-V Solar Cells.- Organic Solar Cells.- Organic-Inorganic Hybrid Perovskite Solar Cells.- Solar Cells with Photonic and Plasmonic Structures.- Transparent Conductive Oxide Materials.- High-Mobility Transparent Conductive Oxide Layers.