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Introduction to Testability in Vlsi Design
Seiten
1993
|
1998 ed.
Kluwer Academic Publishers (Verlag)
978-0-442-00269-5 (ISBN)
Kluwer Academic Publishers (Verlag)
978-0-442-00269-5 (ISBN)
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Discusses the importance of structured testing in the design cycle of the electronics industry. The book has been written for practising engineers but also explains the complexities of testing in such a way that it is also suitable for students.
Increasing complexity and higher levels of integration at both the chip and system level have challenged conventional testing philosophies. Both design and test engineers are becoming more aware of the importance of a structured testing strategy early in the design cycle to increased "time-to-market", a key element in the economics of the electronics industry. There is a need for a book to address testing issues from this perspective and provide solutions to enhance testability. This book has been written with practising engineers in mind, but also explains the complexities of testing to students. It focuses on design for testability, and thus on the quality of the final design. This book should be of interest to VLSI design engineers in the semiconductor and computer industries, test engineers and undergraduate and postgraduate engineering students studying testing.
Increasing complexity and higher levels of integration at both the chip and system level have challenged conventional testing philosophies. Both design and test engineers are becoming more aware of the importance of a structured testing strategy early in the design cycle to increased "time-to-market", a key element in the economics of the electronics industry. There is a need for a book to address testing issues from this perspective and provide solutions to enhance testability. This book has been written with practising engineers in mind, but also explains the complexities of testing to students. It focuses on design for testability, and thus on the quality of the final design. This book should be of interest to VLSI design engineers in the semiconductor and computer industries, test engineers and undergraduate and postgraduate engineering students studying testing.
Erscheint lt. Verlag | 30.6.1993 |
---|---|
Zusatzinfo | 40 illustrations |
Verlagsort | Dordrecht |
Sprache | englisch |
Maße | 150 x 230 mm |
Themenwelt | Naturwissenschaften |
Technik ► Elektrotechnik / Energietechnik | |
Technik ► Maschinenbau | |
ISBN-10 | 0-442-00269-6 / 0442002696 |
ISBN-13 | 978-0-442-00269-5 / 9780442002695 |
Zustand | Neuware |
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