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Critical Phenomena at Surfaces and Interfaces

Evanescent X-Ray and Neutron Scattering

Helmut Dosch (Autor)

X, 145 Seiten
1992
Springer Berlin (Hersteller)
978-3-540-54534-7 (ISBN)
68,55 inkl. MwSt
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This volume treats the scattering of evanascent X-ray and neutron waves inside a solid. Particular emphasis is put on the use of this technique to extract microscopic information from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
Much progress has been made in the understanding of critical phenomena at surfaces and interfaces as a result of the novel experimental technique of grazing angle x-ray and neuron scattering, and theoretical concepts and predictions such as surface-induced order and disorder. This volume treats the scattering of evanascent x-ray and neutron waves inside a solid. Particular emphasis is put on the use of this technique to extract microscopic information from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
Zusatzinfo 69 figs.
Verlagsort Berlin
Sprache englisch
Gewicht 370 g
Einbandart gebunden
Themenwelt Naturwissenschaften Physik / Astronomie Hochenergiephysik / Teilchenphysik
ISBN-10 3-540-54534-4 / 3540545344
ISBN-13 978-3-540-54534-7 / 9783540545347
Zustand Neuware
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