Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms

(Autor)

Buch | Hardcover
XIV, 100 Seiten
2016 | 1st ed. 2017
Springer International Publishing (Verlag)
978-3-319-48301-6 (ISBN)

Lese- und Medienproben

Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms - Jozef Veselý
106,99 inkl. MwSt
This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations.

Introduction.- Iron-Rich Iron Aluminides.- Experimental Methods.- Results.- Discussion.- Summary. 

Erscheinungsdatum
Reihe/Serie Springer Theses
Zusatzinfo XIV, 100 p. 86 illus., 21 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Chemie Physikalische Chemie
Naturwissenschaften Physik / Astronomie
Schlagworte 3D Dislocation Modelling • AFM of Surface Dislocations • Characterization and Evaluation of Materials • Condensed matter physics • Iron Aluminides • Iron-Rich Iron Aluminides • materials / states of matter • Mathematical Physics • Numerical and Computational Physics, Simulation • Physics • Physics and Astronomy • Scientific equipment, experiments and techniques • Slip Line Structures • Slip Systems • Spectroscopy and Microscopy • Spectrum analysis, spectrochemistry, mass spectrom • Surface Dislocation Distribution • TEM Characterization of Bulk Dislocations • Testing of materials
ISBN-10 3-319-48301-3 / 3319483013
ISBN-13 978-3-319-48301-6 / 9783319483016
Zustand Neuware
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