In-situ Materials Characterization -

In-situ Materials Characterization

Across Spatial and Temporal Scales
Buch | Softcover
XI, 256 Seiten
2016 | 1. Softcover reprint of the original 1st ed. 2014
Springer Berlin (Verlag)
978-3-662-51976-9 (ISBN)
106,99 inkl. MwSt
The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales.
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

Scanning Probe Microscopy on 'Live' Catalysts.- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources.- Advanced in situ transmission electron microscopy.- Ultra-fast TEM and Electron Diffraction.- In-Situ Materials Characterization with FIB/SEM.- In-situ X-ray photoelectron spectroscopy.- "Real-time" probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy.- Time-Resolved Neutron Scattering.- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.

Erscheinungsdatum
Reihe/Serie Springer Series in Materials Science
Zusatzinfo XI, 256 p. 124 illus., 78 illus. in color.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik
Schlagworte Characterization and Evaluation of Materials • In-situ characterization • Material dynamics • Materials Science • nanoanalysis • Nanoscale materials • nanoscale science and technology • nanotechnology • neutron scattering • photoelectron spectroscopy • Physics and Astronomy • scanning probe techniques • Scientific equipment, experiments and techniques • Spectroscopy and Microscopy • Spectrum analysis, spectrochemistry, mass spectrom • Structural engineering • Structural Materials • Structure-property • Surface chemistry and adsorption • Surfaces and Interfaces, Thin Films • Testing of materials • Ultra-fast analysis • X-ray absorption spectroscopy
ISBN-10 3-662-51976-3 / 3662519763
ISBN-13 978-3-662-51976-9 / 9783662519769
Zustand Neuware
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