Resonant X-Ray Scattering in Correlated Systems

Buch | Hardcover
VII, 241 Seiten
2017 | 1st ed. 2017
Springer Berlin (Verlag)
978-3-662-53225-6 (ISBN)

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Resonant X-Ray Scattering in Correlated Systems -
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The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan.Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.

Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara).- Resonant X-ray scattering in 3d electron systems (H. Nakao).- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura).- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima).- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati).- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).


Erscheinungsdatum
Reihe/Serie Springer Tracts in Modern Physics
Zusatzinfo VII, 241 p. 151 illus., 25 illus. in color.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Naturwissenschaften Physik / Astronomie Thermodynamik
Schlagworte Characterization and Evaluation of Materials • Condensed matter physics • Nanotechnology and Microengineering • Orbital Ordering • Physics and Astronomy • Resonant X-ray Scattering • Scattering Transition Metal Oxides • Spectroscopy and Microscopy • strongly correlated electron systems • X-ray diffraction • X-ray Scattering Oxides
ISBN-10 3-662-53225-5 / 3662532255
ISBN-13 978-3-662-53225-6 / 9783662532256
Zustand Neuware
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