Mixed-Signal Circuits

Thomas Noulis is staff RFMS engineer at Intel Corp., in the Mobile & Communications Group in Munich, Germany. Before joining Intel, he was with HELIC, Inc., initially as analog/RF IC designer and then as R&D engineer. He earned his B.Sc, M.Sc, and Ph.D from the Aristotle University of Thessaloniki, Greece, in collaboration with LAAS, Toulouse, France. From 2004 to 2009, he participated as principal researcher in multiple European and national research projects. Between 2004 and 2010, he also collaborated with numerous universities and technical institutes as visiting-adjunct professor. Dr. Noulis has more than 30 publications in journals, conferences, and book chapters. He holds one French and one world patent. His work has received more than 50 citations. He is an active reviewer of international journals and has given multiple invited presentations. In addition, his research activity has been awarded by various conferences and research organizations.

Ultra-Low-Voltage Analog Filters for Biomedical Systems. Offset Reduction Techniques in Flash A/D Converters. Protecting Mixed-Signal Technologies against Electrostatic Discharges: Challenges and Protection Strategies from Component to System. Variability and Reliability Issues in Mixed-Signal Circuits. Mixed-Signal Circuit Testing Using Wavelet Signatures. Topological Investigations and Phase Noise Analyses in CMOS LC Oscillator Circuits. Design of an Energy-Efficient ZigBee Transceiver. Simulation Techniques for Large-Scale Circuits. Mixed-Signal IC Design Addressed to Substrate Noise Immunity in Bulk Silicon; toward 3D Circuits. FIR Filtering Techniques for Clock and Frequency Generation. Design-for-Test Methods for Mixed-Signal Systems. Built-In Testing and Tuning of Mixed-Signal/RF Systems: Exploiting the Alternative Testing Paradigm. Spectrally Pure Clock versus Flexible Clock: Which One Is More Efficient in Driving Future Electronic System? Machine Learning-Based BIST in Analog/RF ICs. Closed-Loop Spatial Audio Coding.